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Conference Paper: Design of inspection and maintenance models based on the CCC-chart
Title | Design of inspection and maintenance models based on the CCC-chart |
---|---|
Authors | |
Keywords | Economic design Inspection Maintenance Statistical process control |
Issue Date | 2003 |
Publisher | IEEE. |
Citation | Reliability and Maintainability Symposium Proceedings, Florida, USA, 27-30 January 2003, p. 74-81 How to Cite? |
Abstract | In this research, six maintenance models are constructed based on whether minor inspection, major inspection, minor maintenance and major maintenance are performed on a system. The system to study is a production process in which items produced can be classified as either conforming or nonconforming, and a statistical process control chart called CCC-chart (cumulative count control chart) can be applied to monitor the process. The maintenance models are analyzed quantitatively, and selection of models can be based on an economic consideration. The total cost can be broken down into inspection cost, maintenance cost, and the cost due to deterioration of the process. From the analytic results obtained, the choice of maintenance plan can be optimized from an economic point of view. |
Persistent Identifier | http://hdl.handle.net/10722/46592 |
ISSN | 2020 SCImago Journal Rankings: 0.194 |
ISI Accession Number ID | |
References |
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chan, LY | en_HK |
dc.date.accessioned | 2007-10-30T06:53:37Z | - |
dc.date.available | 2007-10-30T06:53:37Z | - |
dc.date.issued | 2003 | en_HK |
dc.identifier.citation | Reliability and Maintainability Symposium Proceedings, Florida, USA, 27-30 January 2003, p. 74-81 | en_HK |
dc.identifier.issn | 0149-144X | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/46592 | - |
dc.description.abstract | In this research, six maintenance models are constructed based on whether minor inspection, major inspection, minor maintenance and major maintenance are performed on a system. The system to study is a production process in which items produced can be classified as either conforming or nonconforming, and a statistical process control chart called CCC-chart (cumulative count control chart) can be applied to monitor the process. The maintenance models are analyzed quantitatively, and selection of models can be based on an economic consideration. The total cost can be broken down into inspection cost, maintenance cost, and the cost due to deterioration of the process. From the analytic results obtained, the choice of maintenance plan can be optimized from an economic point of view. | en_HK |
dc.format.extent | 381676 bytes | - |
dc.format.extent | 28160 bytes | - |
dc.format.mimetype | application/pdf | - |
dc.format.mimetype | application/msword | - |
dc.language | eng | en_HK |
dc.publisher | IEEE. | en_HK |
dc.relation.ispartof | Proceedings of the Annual Reliability and Maintainability Symposium | en_HK |
dc.rights | ©2003 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. | - |
dc.subject | Economic design | en_HK |
dc.subject | Inspection | en_HK |
dc.subject | Maintenance | en_HK |
dc.subject | Statistical process control | en_HK |
dc.title | Design of inspection and maintenance models based on the CCC-chart | en_HK |
dc.type | Conference_Paper | en_HK |
dc.identifier.openurl | http://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0149-144X&volume=&spage=74&epage=81&date=2003&atitle=Design+of+inspection+and+maintenance+models+based+on+the+CCC-chart | en_HK |
dc.identifier.email | Chan, LY: plychan@hku.hk | en_HK |
dc.identifier.authority | Chan, LY=rp00093 | en_HK |
dc.description.nature | published_or_final_version | en_HK |
dc.identifier.doi | 10.1109/RAMS.2003.1181905 | - |
dc.identifier.scopus | eid_2-s2.0-0037270326 | en_HK |
dc.identifier.hkuros | 82002 | - |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-0037270326&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.spage | 74 | en_HK |
dc.identifier.epage | 81 | en_HK |
dc.identifier.isi | WOS:000182081600012 | - |
dc.publisher.place | United States | en_HK |
dc.identifier.scopusauthorid | Chan, LY=7403540482 | en_HK |
dc.identifier.issnl | 0149-144X | - |