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Conference Paper: Design of inspection and maintenance models based on the CCC-chart

TitleDesign of inspection and maintenance models based on the CCC-chart
Authors
KeywordsEconomic design
Inspection
Maintenance
Statistical process control
Issue Date2003
PublisherIEEE.
Citation
Reliability and Maintainability Symposium Proceedings, Florida, USA, 27-30 January 2003, p. 74-81 How to Cite?
AbstractIn this research, six maintenance models are constructed based on whether minor inspection, major inspection, minor maintenance and major maintenance are performed on a system. The system to study is a production process in which items produced can be classified as either conforming or nonconforming, and a statistical process control chart called CCC-chart (cumulative count control chart) can be applied to monitor the process. The maintenance models are analyzed quantitatively, and selection of models can be based on an economic consideration. The total cost can be broken down into inspection cost, maintenance cost, and the cost due to deterioration of the process. From the analytic results obtained, the choice of maintenance plan can be optimized from an economic point of view.
Persistent Identifierhttp://hdl.handle.net/10722/46592
ISSN
2020 SCImago Journal Rankings: 0.194
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorChan, LYen_HK
dc.date.accessioned2007-10-30T06:53:37Z-
dc.date.available2007-10-30T06:53:37Z-
dc.date.issued2003en_HK
dc.identifier.citationReliability and Maintainability Symposium Proceedings, Florida, USA, 27-30 January 2003, p. 74-81en_HK
dc.identifier.issn0149-144Xen_HK
dc.identifier.urihttp://hdl.handle.net/10722/46592-
dc.description.abstractIn this research, six maintenance models are constructed based on whether minor inspection, major inspection, minor maintenance and major maintenance are performed on a system. The system to study is a production process in which items produced can be classified as either conforming or nonconforming, and a statistical process control chart called CCC-chart (cumulative count control chart) can be applied to monitor the process. The maintenance models are analyzed quantitatively, and selection of models can be based on an economic consideration. The total cost can be broken down into inspection cost, maintenance cost, and the cost due to deterioration of the process. From the analytic results obtained, the choice of maintenance plan can be optimized from an economic point of view.en_HK
dc.format.extent381676 bytes-
dc.format.extent28160 bytes-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypeapplication/msword-
dc.languageengen_HK
dc.publisherIEEE.en_HK
dc.relation.ispartofProceedings of the Annual Reliability and Maintainability Symposiumen_HK
dc.rights©2003 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.-
dc.subjectEconomic designen_HK
dc.subjectInspectionen_HK
dc.subjectMaintenanceen_HK
dc.subjectStatistical process controlen_HK
dc.titleDesign of inspection and maintenance models based on the CCC-charten_HK
dc.typeConference_Paperen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0149-144X&volume=&spage=74&epage=81&date=2003&atitle=Design+of+inspection+and+maintenance+models+based+on+the+CCC-charten_HK
dc.identifier.emailChan, LY: plychan@hku.hken_HK
dc.identifier.authorityChan, LY=rp00093en_HK
dc.description.naturepublished_or_final_versionen_HK
dc.identifier.doi10.1109/RAMS.2003.1181905-
dc.identifier.scopuseid_2-s2.0-0037270326en_HK
dc.identifier.hkuros82002-
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0037270326&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.spage74en_HK
dc.identifier.epage81en_HK
dc.identifier.isiWOS:000182081600012-
dc.publisher.placeUnited Statesen_HK
dc.identifier.scopusauthoridChan, LY=7403540482en_HK
dc.identifier.issnl0149-144X-

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