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- Publisher Website: 10.1109/ICIT.2005.1600745
- Scopus: eid_2-s2.0-33847287331
Conference Paper: Optimal morphological filter design for fabric defect detection
Title | Optimal morphological filter design for fabric defect detection |
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Authors | |
Keywords | Defect detection Fabrics Gabor wavelet networks Mechatronics Morphological filters |
Issue Date | 2005 |
Publisher | IEEE. |
Citation | Proceedings Of The Ieee International Conference On Industrial Technology, 2005, v. 2005, p. 799-804 How to Cite? |
Abstract | This paper investigates the problem of automated defect detection for textile fabrics and proposes a new optimal morphological filter design method for solving this problem. Gabor Wavelet Network (GWN) is adopted as a major technique to extract the texture features of textile fabrics. An optimal morphological filter can be constructed based on the texture features extracted. In view of this optimal filter, a new semi-supervised segmentation algorithm is then proposed. The performance of the scheme is evaluated by using a variety of homogeneous textile images with different types of common defects. The test results exhibit accurate defect detection with low false alarm, thus confirming the robustness and effectiveness of the proposed scheme. In addition, it can be shown that the algorithm proposed in this paper is suitable for on-line applications. Indeed, the proposed algorithm is a low cost PC based solution to the problem of defect detection for textile fabrics. © 2005 IEEE. |
Persistent Identifier | http://hdl.handle.net/10722/46562 |
References |
DC Field | Value | Language |
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dc.contributor.author | Mak, KL | en_HK |
dc.contributor.author | Peng, P | en_HK |
dc.contributor.author | Lau, HYK | en_HK |
dc.date.accessioned | 2007-10-30T06:53:00Z | - |
dc.date.available | 2007-10-30T06:53:00Z | - |
dc.date.issued | 2005 | en_HK |
dc.identifier.citation | Proceedings Of The Ieee International Conference On Industrial Technology, 2005, v. 2005, p. 799-804 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/46562 | - |
dc.description.abstract | This paper investigates the problem of automated defect detection for textile fabrics and proposes a new optimal morphological filter design method for solving this problem. Gabor Wavelet Network (GWN) is adopted as a major technique to extract the texture features of textile fabrics. An optimal morphological filter can be constructed based on the texture features extracted. In view of this optimal filter, a new semi-supervised segmentation algorithm is then proposed. The performance of the scheme is evaluated by using a variety of homogeneous textile images with different types of common defects. The test results exhibit accurate defect detection with low false alarm, thus confirming the robustness and effectiveness of the proposed scheme. In addition, it can be shown that the algorithm proposed in this paper is suitable for on-line applications. Indeed, the proposed algorithm is a low cost PC based solution to the problem of defect detection for textile fabrics. © 2005 IEEE. | en_HK |
dc.format.extent | 4780724 bytes | - |
dc.format.extent | 2836 bytes | - |
dc.format.extent | 2656 bytes | - |
dc.format.mimetype | application/pdf | - |
dc.format.mimetype | text/plain | - |
dc.format.mimetype | text/plain | - |
dc.language | eng | en_HK |
dc.publisher | IEEE. | en_HK |
dc.relation.ispartof | Proceedings of the IEEE International Conference on Industrial Technology | en_HK |
dc.rights | ©2005 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. | - |
dc.subject | Defect detection | en_HK |
dc.subject | Fabrics | en_HK |
dc.subject | Gabor wavelet networks | en_HK |
dc.subject | Mechatronics | en_HK |
dc.subject | Morphological filters | en_HK |
dc.title | Optimal morphological filter design for fabric defect detection | en_HK |
dc.type | Conference_Paper | en_HK |
dc.identifier.email | Mak, KL:makkl@hkucc.hku.hk | en_HK |
dc.identifier.email | Lau, HYK:hyklau@hkucc.hku.hk | en_HK |
dc.identifier.authority | Mak, KL=rp00154 | en_HK |
dc.identifier.authority | Lau, HYK=rp00137 | en_HK |
dc.description.nature | published_or_final_version | en_HK |
dc.identifier.doi | 10.1109/ICIT.2005.1600745 | en_HK |
dc.identifier.scopus | eid_2-s2.0-33847287331 | en_HK |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-33847287331&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 2005 | en_HK |
dc.identifier.spage | 799 | en_HK |
dc.identifier.epage | 804 | en_HK |
dc.identifier.scopusauthorid | Mak, KL=7102680226 | en_HK |
dc.identifier.scopusauthorid | Peng, P=7102844225 | en_HK |
dc.identifier.scopusauthorid | Lau, HYK=7201497761 | en_HK |
dc.identifier.citeulike | 6013869 | - |