Showing results 3 to 4 of 4
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Title | Author(s) | Issue Date | Views | |
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RTN and BTI in nanoscale MOSFETs: A comprehensive statistical simulation study Journal:Solid-State Electronics | 2013 | 48 | ||
Statistical interactions of multiple oxide traps under BTI stress of nanoscale MOSFETs Journal:IEEE Electron Device Letters | 2013 | 44 |