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Conference Paper: Carbon nanotube transistors with 60mV/decade switching and its capacitance measurement

TitleCarbon nanotube transistors with 60mV/decade switching and its capacitance measurement
Authors
Keywords60mV/decade
Capacitance
Carbon nanotube
FET
Mobility
Issue Date2007
Citation
2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007, Technical Proceedings, 2007, v. 1, p. 57-60 How to Cite?
AbstractRecently, we have been able to approach the ultimate vertical scaling limit of carbon nanotube field effect transistors (FETs) and reliably achieve S ∼ 60 mV/decade at room temperature, by non-covalent functionalization of single walled carbon nonotubes (SWNTs) with ploy-T DNA molecules, which can impart functional groups of sufficient density and stability for uniform and conformai ALD of high-κ dielectrics (HfO2) with thickness down to 3 nm on SWNTs. Moreover, the small top gate stack capacitance (∼300aF/ μ m) of the SWNT FET has been successfully measured directly, using a special technique. The mobility of the SWNT FETs at room temperature is also extracted by the capacitance measured directly.
Persistent Identifierhttp://hdl.handle.net/10722/334149

 

DC FieldValueLanguage
dc.contributor.authorLu, Yuerui-
dc.contributor.authorDai, Hongjie-
dc.contributor.authorNishi, Yoshio-
dc.date.accessioned2023-10-20T06:46:04Z-
dc.date.available2023-10-20T06:46:04Z-
dc.date.issued2007-
dc.identifier.citation2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007, Technical Proceedings, 2007, v. 1, p. 57-60-
dc.identifier.urihttp://hdl.handle.net/10722/334149-
dc.description.abstractRecently, we have been able to approach the ultimate vertical scaling limit of carbon nanotube field effect transistors (FETs) and reliably achieve S ∼ 60 mV/decade at room temperature, by non-covalent functionalization of single walled carbon nonotubes (SWNTs) with ploy-T DNA molecules, which can impart functional groups of sufficient density and stability for uniform and conformai ALD of high-κ dielectrics (HfO2) with thickness down to 3 nm on SWNTs. Moreover, the small top gate stack capacitance (∼300aF/ μ m) of the SWNT FET has been successfully measured directly, using a special technique. The mobility of the SWNT FETs at room temperature is also extracted by the capacitance measured directly.-
dc.languageeng-
dc.relation.ispartof2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007, Technical Proceedings-
dc.subject60mV/decade-
dc.subjectCapacitance-
dc.subjectCarbon nanotube-
dc.subjectFET-
dc.subjectMobility-
dc.titleCarbon nanotube transistors with 60mV/decade switching and its capacitance measurement-
dc.typeConference_Paper-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.scopuseid_2-s2.0-34548027027-
dc.identifier.volume1-
dc.identifier.spage57-
dc.identifier.epage60-

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