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Conference Paper: Parasitic capacitive coupling analysis of carbon nanotube based infrared detector

TitleParasitic capacitive coupling analysis of carbon nanotube based infrared detector
Authors
KeywordsCapacitance
Carbon Nanotube
Infrared
Polymer
Issue Date2015
PublisherIEEE.
Citation
The 15th IEEE International Conference on Nanotechnology (IEEE-NANO 2015), Rome, Italy, 27-30 July 2015. In Conference Proceedings, 2015, p. 1226-1230 How to Cite?
AbstractInfrared (IR) sensor has extended imaging from visible spectrum to millimeter wavelength, which has been widely used for military and civilian application. While the unusual carbon nanotube (CNT) based nanotechnology has been made much progress in research and industry, the unique properties of CNT lead to investigate of CNT based IR detectors. In this paper, CNTs-metal based Schottky barrier structure non cryogenic IR detector was designed to detect IR irradiance. The parasitic capacitance was analyzed when device size decreased. The experimental results show that the parasitic capacitance between electrodes deteriorates photocurrent response in CNT IR detector. Meanwhile, low dielectric constant polymer material polyimide was proposed in IR detector design, the experimental results have shown that, the polymer based interfacial layer has strong substrate noise reduction on CNT IR sensor. The dark current is less than 0.3 nA under the condition of photocurrent 100 nA, the noise at 0.5 nA when CNT-metal contact was fabricated on polyimide material. © 2015 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/235001
ISBN

 

DC FieldValueLanguage
dc.contributor.authorChen, L-
dc.contributor.authorXi, N-
dc.contributor.authorZhou, Z-
dc.contributor.authorSong, B-
dc.contributor.authorYang, Y-
dc.contributor.authorSun, Z-
dc.contributor.authorHao, Y-
dc.date.accessioned2016-10-14T13:50:38Z-
dc.date.available2016-10-14T13:50:38Z-
dc.date.issued2015-
dc.identifier.citationThe 15th IEEE International Conference on Nanotechnology (IEEE-NANO 2015), Rome, Italy, 27-30 July 2015. In Conference Proceedings, 2015, p. 1226-1230-
dc.identifier.isbn978-146738155-0-
dc.identifier.urihttp://hdl.handle.net/10722/235001-
dc.description.abstractInfrared (IR) sensor has extended imaging from visible spectrum to millimeter wavelength, which has been widely used for military and civilian application. While the unusual carbon nanotube (CNT) based nanotechnology has been made much progress in research and industry, the unique properties of CNT lead to investigate of CNT based IR detectors. In this paper, CNTs-metal based Schottky barrier structure non cryogenic IR detector was designed to detect IR irradiance. The parasitic capacitance was analyzed when device size decreased. The experimental results show that the parasitic capacitance between electrodes deteriorates photocurrent response in CNT IR detector. Meanwhile, low dielectric constant polymer material polyimide was proposed in IR detector design, the experimental results have shown that, the polymer based interfacial layer has strong substrate noise reduction on CNT IR sensor. The dark current is less than 0.3 nA under the condition of photocurrent 100 nA, the noise at 0.5 nA when CNT-metal contact was fabricated on polyimide material. © 2015 IEEE.-
dc.languageeng-
dc.publisherIEEE.-
dc.relation.ispartofIEEE International Conference on Nanotechnology (IEEE-NANO) Proceedings-
dc.rightsIEEE International Conference on Nanotechnology (IEEE-NANO) Proceedings. Copyright © IEEE.-
dc.rights©2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.-
dc.subjectCapacitance-
dc.subjectCarbon Nanotube-
dc.subjectInfrared-
dc.subjectPolymer-
dc.titleParasitic capacitive coupling analysis of carbon nanotube based infrared detector-
dc.typeConference_Paper-
dc.identifier.emailXi, N: xining@hku.hk-
dc.identifier.authorityXi, N=rp02044-
dc.description.natureLink_to_subscribed_fulltext-
dc.identifier.doi10.1109/NANO.2015.7388850-
dc.identifier.scopuseid_2-s2.0-84964389083-
dc.identifier.hkuros269326-
dc.identifier.spage1226-
dc.identifier.epage1230-
dc.publisher.placeUnited States-
dc.customcontrol.immutablesml 161018-

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