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Article: Negative gate-bias instability of ZnO thin-film transistors studied by current–voltage and capacitance–voltage analyses

TitleNegative gate-bias instability of ZnO thin-film transistors studied by current–voltage and capacitance–voltage analyses
Authors
Issue Date2014
Citation
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, 2014, v. 32, article no. 061208 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/217032

 

DC FieldValueLanguage
dc.contributor.authorLiu, Y-
dc.contributor.authorMo, S-
dc.contributor.authorYao, R-
dc.contributor.authorLai, PT-
dc.date.accessioned2015-09-18T05:46:35Z-
dc.date.available2015-09-18T05:46:35Z-
dc.date.issued2014-
dc.identifier.citationJournal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, 2014, v. 32, article no. 061208-
dc.identifier.urihttp://hdl.handle.net/10722/217032-
dc.languageeng-
dc.relation.ispartofJournal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena-
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.rightsCopyright (2014) American Vacuum Society. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Vacuum Society. The following article appeared in (Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, 2014, v. 32, article no. 061208) and may be found at (http://dx.doi.org/10.1116/1.4901505).-
dc.titleNegative gate-bias instability of ZnO thin-film transistors studied by current–voltage and capacitance–voltage analyses-
dc.typeArticle-
dc.identifier.emailLai, PT: laip@eee.hku.hk-
dc.identifier.authorityLai, PT=rp00130-
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1116/1.4901505-
dc.identifier.hkuros254209-
dc.identifier.volume32-
dc.identifier.spagearticle no. 061208-
dc.identifier.epagearticle no. 061208-

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