File Download

There are no files associated with this item.

  Links for fulltext
     (May Require Subscription)
Supplementary

Conference Paper: 3D nano forces sensing for an AFM based nanomanipulator

Title3D nano forces sensing for an AFM based nanomanipulator
Authors
Keywords3D Nano Forces modeling
Parameters Calibration
AFM Based Nanomanipulator
Issue Date2004
Citation
Proceedings of the 2004 International Conference on Information Acquisition, ICIA 2004, 2004, p. 208-212 How to Cite?
AbstractAtomic Force Microscope (AFM) has been proven to be a useful tool to characterize and change the sample surface down to the nanometer scale. However, in the AFM based nano manipulation, the main problem is the lack of real-time sensory feedback for a user, which makes the manipulation almost in the dark and inefficient In this paper, the AFM probe micro cantilever-tip is used not only as an end effector but also as a three dimensional (3D) nano forces sensor for measuring the interactive forces between the AFM probe tip and the object or substrate in nanomanipulation. The nano forces acting on cantilever-tip is modeled and the real-time PSD signals are used to calculate the forces. With new parameters calibration method used, the real 3D nano forces can be easily got and then fed to a haptic/force device for operator to feel, thus real-time manipulation forces information is obtained, with which the efficiency of nanomanipulation can be significantly improved. Nano-imprint experiments verify the effectiveness of 3D forces sensing system and efficiency improvement of nano manipulation using this system. © 2004 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/212817

 

DC FieldValueLanguage
dc.contributor.authorTian, Xiaojun-
dc.contributor.authorLiu, Lianqing-
dc.contributor.authorJiao, Niandong-
dc.contributor.authorWang, Yuechao-
dc.contributor.authorDong, Zaili-
dc.contributor.authorXi, Ning-
dc.date.accessioned2015-07-28T04:05:06Z-
dc.date.available2015-07-28T04:05:06Z-
dc.date.issued2004-
dc.identifier.citationProceedings of the 2004 International Conference on Information Acquisition, ICIA 2004, 2004, p. 208-212-
dc.identifier.urihttp://hdl.handle.net/10722/212817-
dc.description.abstractAtomic Force Microscope (AFM) has been proven to be a useful tool to characterize and change the sample surface down to the nanometer scale. However, in the AFM based nano manipulation, the main problem is the lack of real-time sensory feedback for a user, which makes the manipulation almost in the dark and inefficient In this paper, the AFM probe micro cantilever-tip is used not only as an end effector but also as a three dimensional (3D) nano forces sensor for measuring the interactive forces between the AFM probe tip and the object or substrate in nanomanipulation. The nano forces acting on cantilever-tip is modeled and the real-time PSD signals are used to calculate the forces. With new parameters calibration method used, the real 3D nano forces can be easily got and then fed to a haptic/force device for operator to feel, thus real-time manipulation forces information is obtained, with which the efficiency of nanomanipulation can be significantly improved. Nano-imprint experiments verify the effectiveness of 3D forces sensing system and efficiency improvement of nano manipulation using this system. © 2004 IEEE.-
dc.languageeng-
dc.relation.ispartofProceedings of the 2004 International Conference on Information Acquisition, ICIA 2004-
dc.subject3D Nano Forces modeling-
dc.subjectParameters Calibration-
dc.subjectAFM Based Nanomanipulator-
dc.title3D nano forces sensing for an AFM based nanomanipulator-
dc.typeConference_Paper-
dc.description.natureLink_to_subscribed_fulltext-
dc.identifier.scopuseid_2-s2.0-21444450648-
dc.identifier.spage208-
dc.identifier.epage212-

Export via OAI-PMH Interface in XML Formats


OR


Export to Other Non-XML Formats