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Article: A low-frequency noise model with carrier generation-recombination process for pentacene organic thin-film transistor

TitleA low-frequency noise model with carrier generation-recombination process for pentacene organic thin-film transistor
Authors
Issue Date2013
PublisherAmerican Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jsp
Citation
Journal of Applied Physics, 2013, v. 114 n. 4, article no. 044503 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/202556
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorHAN, Cen_US
dc.contributor.authorQIAN, Len_US
dc.contributor.authorLeung, CHen_US
dc.contributor.authorChe, CMen_US
dc.contributor.authorLai, PTen_US
dc.date.accessioned2014-09-19T08:41:04Z-
dc.date.available2014-09-19T08:41:04Z-
dc.date.issued2013en_US
dc.identifier.citationJournal of Applied Physics, 2013, v. 114 n. 4, article no. 044503en_US
dc.identifier.urihttp://hdl.handle.net/10722/202556-
dc.languageengen_US
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jspen_US
dc.relation.ispartofJournal of Applied Physicsen_US
dc.rightsJournal of Applied Physics. Copyright © American Institute of Physics-
dc.rightsCopyright 2013 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Journal of Applied Physics, 2013, v. 114 n. 4, article no. 044503 and may be found at http://scitation.aip.org/content/aip/journal/jap/114/4/10.1063/1.4816103-
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.titleA low-frequency noise model with carrier generation-recombination process for pentacene organic thin-film transistoren_US
dc.typeArticleen_US
dc.identifier.emailLeung, CH: chleung@eee.hku.hken_US
dc.identifier.emailChe, CM: cmche@hku.hken_US
dc.identifier.emailLai, PT: laip@eee.hku.hken_US
dc.identifier.authorityLeung, CH=rp00146en_US
dc.identifier.authorityChe, CM=rp00670en_US
dc.identifier.authorityLai, PT=rp00130en_US
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1063/1.4816103-
dc.identifier.hkuros236408en_US
dc.identifier.hkuros240488-
dc.identifier.volume114en_US
dc.identifier.spage044503-1en_US
dc.identifier.epage044503-6en_US
dc.identifier.isiWOS:000322539300097-
dc.publisher.placeNew York, USAen_US

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