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Conference Paper: Practical consequences of model misfit
Title | Practical consequences of model misfit |
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Authors | |
Issue Date | 2010 |
Publisher | International Test Commission (ITC). |
Citation | The 7th Conference of the International Test Commission (ITC), Hong Kong, China, 19-21 July 2010 How to Cite? |
Description | Conference Theme: Challenges and Opportunities in Testing and Assessment in a Globalized Economy |
Persistent Identifier | http://hdl.handle.net/10722/187347 |
DC Field | Value | Language |
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dc.contributor.author | Zhao, Y | en_US |
dc.contributor.author | Hambleton, RK | en_US |
dc.date.accessioned | 2013-08-20T12:38:30Z | - |
dc.date.available | 2013-08-20T12:38:30Z | - |
dc.date.issued | 2010 | en_US |
dc.identifier.citation | The 7th Conference of the International Test Commission (ITC), Hong Kong, China, 19-21 July 2010 | en_US |
dc.identifier.uri | http://hdl.handle.net/10722/187347 | - |
dc.description | Conference Theme: Challenges and Opportunities in Testing and Assessment in a Globalized Economy | - |
dc.language | eng | en_US |
dc.publisher | International Test Commission (ITC). | - |
dc.relation.ispartof | Conference of the International Test Commission (ITC) | en_US |
dc.title | Practical consequences of model misfit | en_US |
dc.type | Conference_Paper | en_US |
dc.identifier.hkuros | 216689 | en_US |