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Conference Paper: Accessibility analysis for CMM inspection planning by means of haptic device and STL representation

TitleAccessibility analysis for CMM inspection planning by means of haptic device and STL representation
Authors
Wang, YChen, YZhang, WLiu, DZhang, R
KeywordsAccessibility Analysis
Cmm
Haptic Device
Stl
Issue Date2009
Citation
2009 Ieee International Conference On Virtual Environments, Human-Computer Interfaces, And Measurements Systems, Vecims 2009 - Proceedings, 2009, p. 174-178 How to Cite?
DOI: http://dx.doi.org/10.1109/VECIMS.2009.5068888
AbstractInspection planning plays one of important roles in examining a manufactured part in 3D sizes, positions and forms using coordinate measuring machine (CMM). Accessibility Analysis must be done during CMM inspection planning. Usually, accessibility analysis is based on the computation of a part's computer-aided design (CAD) model and the model of a probe. In this paper, a new accessibility analysis method for CMM inspection planning is proposed based on a haptic device and STL representation. Different collision modes are analyzed. A quick collision detection algorithm is given, which is based on the STL representation. Force response is analyzed to distinguish between an occurred collision and a normal contacting of the tip to an inspection point. Using STL representation, the virtual CMM probe unit model is more precise, which results in the accessibility analysis implemented precisely. With the force feedback generated by a Phantom Desktop haptic device, the accessibility analysis is performed much easier. ©2009 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/159003
ISI Accession Number ID
WOS:000270760700034
References
References in Scopus

 

DC FieldValueLanguage
dc.contributor.authorWang, Yen_US
dc.contributor.authorChen, Yen_US
dc.contributor.authorZhang, Wen_US
dc.contributor.authorLiu, Den_US
dc.contributor.authorZhang, Ren_US
dc.date.accessioned2012-08-08T09:05:04Z-
dc.date.available2012-08-08T09:05:04Z-
dc.date.issued2009en_US
dc.identifier.citation2009 Ieee International Conference On Virtual Environments, Human-Computer Interfaces, And Measurements Systems, Vecims 2009 - Proceedings, 2009, p. 174-178en_US
dc.identifier.urihttp://hdl.handle.net/10722/159003-
dc.description.abstractInspection planning plays one of important roles in examining a manufactured part in 3D sizes, positions and forms using coordinate measuring machine (CMM). Accessibility Analysis must be done during CMM inspection planning. Usually, accessibility analysis is based on the computation of a part's computer-aided design (CAD) model and the model of a probe. In this paper, a new accessibility analysis method for CMM inspection planning is proposed based on a haptic device and STL representation. Different collision modes are analyzed. A quick collision detection algorithm is given, which is based on the STL representation. Force response is analyzed to distinguish between an occurred collision and a normal contacting of the tip to an inspection point. Using STL representation, the virtual CMM probe unit model is more precise, which results in the accessibility analysis implemented precisely. With the force feedback generated by a Phantom Desktop haptic device, the accessibility analysis is performed much easier. ©2009 IEEE.en_US
dc.languageengen_US
dc.relation.ispartof2009 IEEE International Conference on Virtual Environments, Human-Computer Interfaces, and Measurements Systems, VECIMS 2009 - Proceedingsen_US
dc.subjectAccessibility Analysisen_US
dc.subjectCmmen_US
dc.subjectHaptic Deviceen_US
dc.subjectStlen_US
dc.titleAccessibility analysis for CMM inspection planning by means of haptic device and STL representationen_US
dc.typeConference_Paperen_US
dc.identifier.emailChen, Y:yhchen@hkucc.hku.hken_US
dc.identifier.authorityChen, Y=rp00099en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1109/VECIMS.2009.5068888en_US
dc.identifier.scopuseid_2-s2.0-70349926021en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-70349926021&selection=ref&src=s&origin=recordpageen_US
dc.identifier.spage174en_US
dc.identifier.epage178en_US
dc.identifier.isiWOS:000270760700034-
dc.identifier.scopusauthoridWang, Y=7601492781en_US
dc.identifier.scopusauthoridChen, Y=7601430448en_US
dc.identifier.scopusauthoridZhang, W=8925842600en_US
dc.identifier.scopusauthoridLiu, D=35092917300en_US
dc.identifier.scopusauthoridZhang, R=35313064400en_US

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