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  Patent History
  • Application
    US 11/302048 2005-12-13
  • Publication
    US 20070131453 2007-06-14
  • Granted
    US 7404455 2008-07-29

granted patent: Automatic Spt Monitor

TitleAutomatic Spt Monitor
Granted PatentUS 7404455
Granted Date2008-07-29
Priority Date2005-12-13 US 11/302048
Inventors
Issue Date2008
Citation
US Patent 7404455. Washington, DC: US Patent and Trademark Office (USPTO), 2008 How to Cite?
AbstractAn Apparatus Is Used With An Impact Hammer Penetration Assemble Such As Standard Penetration Test (Spt) In Geotechnical Engineering. The Impact Hammer Penetration Assembly Comprises A Penetration Sample, A Series Of Rods Coupled Together And An Impact Hammer Apparatus. The Drop Of The Hammer From A Constant Height Hits The Coupled Rods And Sampler In Series And Forces The Sampler Deeper Into The Ground. The Apparatus Includes A Tip Depth Transducer And Sampler To Output A First Electrical Signal That Is A Function Of The Sampler Tip Position. A Shock Force Transducer Communicates The Axial Shock Force In The Rod To Output A Second Electrical Signal That Is A Function Of The Rod Shock Force And Hammer Blows.; A Shock Penetration Transducer Communicates The Movement Of The Coupled Rods And Sampler To Output A Third Electrical Signal That Is A Function Of The Sampler Penetration Due To The Hammer Blows. A Micro-Process Controller Monitors And Processes The First, Second And Third Signals In Real Time.
Persistent Identifierhttp://hdl.handle.net/10722/142201
References

 

DC FieldValueLanguage
dc.date.accessioned2011-10-19T06:34:53Z-
dc.date.available2011-10-19T06:34:53Z-
dc.date.issued2008-
dc.identifier.citationUS Patent 7404455. Washington, DC: US Patent and Trademark Office (USPTO), 2008en_HK
dc.identifier.urihttp://hdl.handle.net/10722/142201-
dc.description.abstractAn Apparatus Is Used With An Impact Hammer Penetration Assemble Such As Standard Penetration Test (Spt) In Geotechnical Engineering. The Impact Hammer Penetration Assembly Comprises A Penetration Sample, A Series Of Rods Coupled Together And An Impact Hammer Apparatus. The Drop Of The Hammer From A Constant Height Hits The Coupled Rods And Sampler In Series And Forces The Sampler Deeper Into The Ground. The Apparatus Includes A Tip Depth Transducer And Sampler To Output A First Electrical Signal That Is A Function Of The Sampler Tip Position. A Shock Force Transducer Communicates The Axial Shock Force In The Rod To Output A Second Electrical Signal That Is A Function Of The Rod Shock Force And Hammer Blows.; A Shock Penetration Transducer Communicates The Movement Of The Coupled Rods And Sampler To Output A Third Electrical Signal That Is A Function Of The Sampler Penetration Due To The Hammer Blows. A Micro-Process Controller Monitors And Processes The First, Second And Third Signals In Real Time.en_HK
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License For Public Patent Documents-
dc.titleAutomatic Spt Monitoren_HK
dc.typePatenten_US
dc.identifier.emailLee, Chack Fan:leecf@hkucc.hku.hken_US
dc.identifier.emailLee, Peter Kai Kwong:en_US
dc.identifier.emailTham, Leslie George:en_US
dc.identifier.emailYue, Zhong Qi:yueqzq@hkucc.hku.hken_US
dc.identifier.authorityLee, Chack Fan=rp00139en_US
dc.identifier.authorityYue, Zhong Qi=rp00209en_US
dc.description.naturepublished_or_final_version-
dc.contributor.inventorYue Zhong Qien_US
dc.contributor.inventorLee, CFen_US
dc.contributor.inventorLee Peter Kai Kwongen_US
dc.contributor.inventorTham Leslie Georgeen_US
patents.identifier.applicationUS 11/302048en_HK
patents.identifier.grantedUS 7404455en_HK
patents.description.assigneeUniv Hong Kong [Cn]en_HK
patents.description.countryUnited States of Americaen_HK
patents.date.publication2007-06-14en_HK
patents.date.granted2008-07-29en_HK
dc.relation.referencesUS 6105690 (A) 2000-08-22en_HK
dc.relation.referencesUS 6286613 (B1) 2001-09-11en_HK
dc.relation.referencesUS 2003039752 (A1) 2003-02-27en_HK
dc.relation.referencesUS 6966950 (B2) 2005-11-22en_HK
dc.relation.referencesUS 2002043404 (A1) 2002-04-18en_HK
dc.relation.referencesUS 2005194134 (A1) 2005-09-08en_HK
dc.relation.referencesUS 7958936 (B2) 2011-06-14en_HK
dc.relation.referencesUS 2002074165 (A1) 2002-06-20en_HK
dc.relation.referencesUS 6637523 (B2) 2003-10-28en_HK
patents.identifier.hkutechidCivE-2005-00206-1en_US
patents.date.application2005-12-13en_HK
patents.date.priority2005-12-13 US 11/302048en_HK
patents.description.ccUSen_HK
patents.identifier.publicationUS 20070131453en_HK
patents.relation.familyCN 1982645 (A) 2007-06-20en_HK
patents.relation.familyUS 2007131453 (A1) 2007-06-14en_HK
patents.relation.familyUS 7404455 (B2) 2008-07-29en_HK
patents.description.kindB2en_HK
patents.typePatent_granteden_HK

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