Granted Patent: Defect Detection System For Quality Assurance Using Automated Visual Inspection

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Patent History

Application
US 09/144588
2001-10-25
Publication
US 20030081215
2003-05-01
Granted
US 6753965
2004-06-22

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- Electrical & Electronic Engineering: Patents
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Title	Defect Detection System For Quality Assurance Using Automated Visual Inspection
Granted Patent	US 6753965
Granted Date	2004-06-22
Priority Date	2001-10-25 US 09/144588 2001-01-09 US 09/260520P
Inventors	Pang, Grantham Kwok Hung Pang, Kwok-hung Grantham
Citation	US Patent 6753965. Washington, DC: US Patent and Trademark Office (USPTO), 2004 [How to Cite?]
Abstract	A Defect Detection Method And System For The Automated Visual Inspection Of Web Materials Is Provided. The Invention Utilize Real Gabor Function (Rgf) Filters With A Non-Linear Function For Estimating The Local Energy. An Example Method For Quality Assurance Using Automated Visual Inspection In Accordance With The Invention Includes The Steps Of: Automated Design Of A Bank Of Rgf Filters; Using These Rgf Filters To Sample The Features Of Image Under Inspection; Using A Non-Linear Function To Compute Local Energy Estimate In The Filtered Images; Combining All The Filtered Images Using Image Fusion; And Finally Thresholding The Resultant Image To Segment The Defects In The Inspection Image. Possible Embodiments Of The Described Invention Include Detection Of Only A Class Of Defects Using A Single Tuned Real Gabor Filter Or A Bank Of Real Gabor Functions.
References	US 5301129 (A) 1994-04-05 US 5774177 (A) 1998-06-30 US 4630304 (A) 1986-12-16 US 5737072 (A) 1998-04-07 US 5740048 (A) 1998-04-14 US 5825501 (A) 1998-10-20 EP 0974831 (A2) 2000-01-26 EP 0974831 (A3) 2000-03-22 EP 0974831 (B1) 2005-01-12

DC Field	Value
dc.contributor.inventor	Pang, Grantham Kwok Hung
dc.contributor.inventor	Pang, Kwok-hung Grantham
dc.date.accessioned	2011-10-19T06:30:05Z
patents.date.application	2001-10-25
dc.date.available	2011-10-19T06:30:05Z
patents.date.granted	2004-06-22
patents.date.priority	2001-10-25 US 09/144588
patents.date.priority	2001-01-09 US 09/260520P
patents.date.publication	2003-05-01
dc.description.abstract	A Defect Detection Method And System For The Automated Visual Inspection Of Web Materials Is Provided. The Invention Utilize Real Gabor Function (Rgf) Filters With A Non-Linear Function For Estimating The Local Energy. An Example Method For Quality Assurance Using Automated Visual Inspection In Accordance With The Invention Includes The Steps Of: Automated Design Of A Bank Of Rgf Filters; Using These Rgf Filters To Sample The Features Of Image Under Inspection; Using A Non-Linear Function To Compute Local Energy Estimate In The Filtered Images; Combining All The Filtered Images Using Image Fusion; And Finally Thresholding The Resultant Image To Segment The Defects In The Inspection Image. Possible Embodiments Of The Described Invention Include Detection Of Only A Class Of Defects Using A Single Tuned Real Gabor Filter Or A Bank Of Real Gabor Functions.
patents.description.assignee	Univ Hong Kong [Us]
patents.description.cc	US
patents.description.country	United States of America
patents.description.kind	B2
dc.description.nature	published_or_final_version
patents.identifier.application	US 09/144588
dc.identifier.citation	US Patent 6753965. Washington, DC: US Patent and Trademark Office (USPTO), 2004 [How to Cite?]
patents.identifier.granted	US 6753965
dc.identifier.hkuros	90405
patents.identifier.hkutechid	EEE-2001-00045
patents.identifier.publication	US 20030081215
dc.identifier.uri	http://hdl.handle.net/10722/142133
patents.relation.family	US 2003081215 (A1) 2003-05-01
patents.relation.family	US 6753965 (B2) 2004-06-22
dc.relation.references	US 5301129 (A) 1994-04-05
dc.relation.references	US 5774177 (A) 1998-06-30
dc.relation.references	US 4630304 (A) 1986-12-16
dc.relation.references	US 5737072 (A) 1998-04-07
dc.relation.references	US 5740048 (A) 1998-04-14
dc.relation.references	US 5825501 (A) 1998-10-20
dc.relation.references	EP 0974831 (A2) 2000-01-26
dc.relation.references	EP 0974831 (A3) 2000-03-22
dc.relation.references	EP 0974831 (B1) 2005-01-12
dc.rights	Creative Commons: Attribution 3.0 Hong Kong License For Public Patent Documents
dc.title	Defect Detection System For Quality Assurance Using Automated Visual Inspection
dc.type	Patent
patents.type	Patent_granted

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