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  Patent History
  • Application
    US 09/144588 2001-10-25
  • Publication
    US 20030081215 2003-05-01
  • Granted
    US 6753965 2004-06-22

granted patent: Defect Detection System For Quality Assurance Using Automated Visual Inspection

TitleDefect Detection System For Quality Assurance Using Automated Visual Inspection
Granted PatentUS 6753965
Granted Date2004-06-22
Priority Date2001-10-25 US 09/144588
2001-01-09 US 09/260520P
Inventors
Issue Date2004
Citation
US Patent 6753965. Washington, DC: US Patent and Trademark Office (USPTO), 2004 How to Cite?
Abstract
A Defect Detection Method And System For The Automated Visual Inspection Of Web Materials Is Provided. The Invention Utilize Real Gabor Function (Rgf) Filters With A Non-Linear Function For Estimating The Local Energy. An Example Method For Quality Assurance Using Automated Visual Inspection In Accordance With The Invention Includes The Steps Of: Automated Design Of A Bank Of Rgf Filters; Using These Rgf Filters To Sample The Features Of Image Under Inspection; Using A Non-Linear Function To Compute Local Energy Estimate In The Filtered Images; Combining All The Filtered Images Using Image Fusion; And Finally Thresholding The Resultant Image To Segment The Defects In The Inspection Image. Possible Embodiments Of The Described Invention Include Detection Of Only A Class Of Defects Using A Single Tuned Real Gabor Filter Or A Bank Of Real Gabor Functions.
Persistent Identifierhttp://hdl.handle.net/10722/142133
References

 

DC FieldValueLanguage
dc.date.accessioned2011-10-19T06:30:05Z-
dc.date.available2011-10-19T06:30:05Z-
dc.date.issued2004-
dc.identifier.citationUS Patent 6753965. Washington, DC: US Patent and Trademark Office (USPTO), 2004en_HK
dc.identifier.urihttp://hdl.handle.net/10722/142133-
dc.description.abstractA Defect Detection Method And System For The Automated Visual Inspection Of Web Materials Is Provided. The Invention Utilize Real Gabor Function (Rgf) Filters With A Non-Linear Function For Estimating The Local Energy. An Example Method For Quality Assurance Using Automated Visual Inspection In Accordance With The Invention Includes The Steps Of: Automated Design Of A Bank Of Rgf Filters; Using These Rgf Filters To Sample The Features Of Image Under Inspection; Using A Non-Linear Function To Compute Local Energy Estimate In The Filtered Images; Combining All The Filtered Images Using Image Fusion; And Finally Thresholding The Resultant Image To Segment The Defects In The Inspection Image. Possible Embodiments Of The Described Invention Include Detection Of Only A Class Of Defects Using A Single Tuned Real Gabor Filter Or A Bank Of Real Gabor Functions.en_HK
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License For Public Patent Documents-
dc.titleDefect Detection System For Quality Assurance Using Automated Visual Inspectionen_HK
dc.typePatenten_US
dc.identifier.emailPang, Grantham Kwok Hung:gpang@eee.hku.hken_US
dc.identifier.authorityPang, Grantham Kwok Hung=rp00162en_US
dc.description.naturepublished_or_final_version-
dc.identifier.hkuros90405en_US
dc.contributor.inventorKumar, Aen_US
dc.contributor.inventorPang, Kwok-hung Granthamen_US
patents.identifier.applicationUS 09/144588en_HK
patents.identifier.grantedUS 6753965en_HK
patents.description.assigneeUniv Hong Kong [Us]en_HK
patents.description.countryUnited States of Americaen_HK
patents.date.publication2003-05-01en_HK
patents.date.granted2004-06-22en_HK
dc.relation.referencesUS 5301129 (A) 1994-04-05en_HK
dc.relation.referencesUS 5774177 (A) 1998-06-30en_HK
dc.relation.referencesUS 4630304 (A) 1986-12-16en_HK
dc.relation.referencesUS 5737072 (A) 1998-04-07en_HK
dc.relation.referencesUS 5740048 (A) 1998-04-14en_HK
dc.relation.referencesUS 5825501 (A) 1998-10-20en_HK
dc.relation.referencesEP 0974831 (A2) 2000-01-26en_HK
dc.relation.referencesEP 0974831 (A3) 2000-03-22en_HK
dc.relation.referencesEP 0974831 (B1) 2005-01-12en_HK
patents.identifier.hkutechidEEE-2001-00045en_US
patents.date.application2001-10-25en_HK
patents.date.priority2001-10-25 US 09/144588en_HK
patents.date.priority2001-01-09 US 09/260520Pen_HK
patents.description.ccUSen_HK
patents.identifier.publicationUS 20030081215en_HK
patents.relation.familyUS 2003081215 (A1) 2003-05-01en_HK
patents.relation.familyUS 6753965 (B2) 2004-06-22en_HK
patents.description.kindB2en_HK
patents.typePatent_granteden_HK

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