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  Patent History
  • Application
    US 09/144588 2001-10-25
  • Publication
    US 20030081215 2003-05-01
  • Granted
    US 6753965 2004-06-22

granted patent: Defect Detection System For Quality Assurance Using Automated Visual Inspection

TitleDefect Detection System For Quality Assurance Using Automated Visual Inspection
Granted PatentUS 6753965
Granted Date2004-06-22
Priority Date2001-10-25 US 09/144588
2001-01-09 US 09/260520P
Inventors
Issue Date2004
Citation
US Patent 6753965. Washington, DC: US Patent and Trademark Office (USPTO), 2004 How to Cite?
AbstractA Defect Detection Method And System For The Automated Visual Inspection Of Web Materials Is Provided. The Invention Utilize Real Gabor Function (Rgf) Filters With A Non-Linear Function For Estimating The Local Energy. An Example Method For Quality Assurance Using Automated Visual Inspection In Accordance With The Invention Includes The Steps Of: Automated Design Of A Bank Of Rgf Filters; Using These Rgf Filters To Sample The Features Of Image Under Inspection; Using A Non-Linear Function To Compute Local Energy Estimate In The Filtered Images; Combining All The Filtered Images Using Image Fusion; And Finally Thresholding The Resultant Image To Segment The Defects In The Inspection Image. Possible Embodiments Of The Described Invention Include Detection Of Only A Class Of Defects Using A Single Tuned Real Gabor Filter Or A Bank Of Real Gabor Functions.
Persistent Identifierhttp://hdl.handle.net/10722/142133
References

 

DC FieldValueLanguage
dc.date.accessioned2011-10-19T06:30:05Z-
dc.date.available2011-10-19T06:30:05Z-
dc.date.issued2004-
dc.identifier.citationUS Patent 6753965. Washington, DC: US Patent and Trademark Office (USPTO), 2004en_HK
dc.identifier.urihttp://hdl.handle.net/10722/142133-
dc.description.abstractA Defect Detection Method And System For The Automated Visual Inspection Of Web Materials Is Provided. The Invention Utilize Real Gabor Function (Rgf) Filters With A Non-Linear Function For Estimating The Local Energy. An Example Method For Quality Assurance Using Automated Visual Inspection In Accordance With The Invention Includes The Steps Of: Automated Design Of A Bank Of Rgf Filters; Using These Rgf Filters To Sample The Features Of Image Under Inspection; Using A Non-Linear Function To Compute Local Energy Estimate In The Filtered Images; Combining All The Filtered Images Using Image Fusion; And Finally Thresholding The Resultant Image To Segment The Defects In The Inspection Image. Possible Embodiments Of The Described Invention Include Detection Of Only A Class Of Defects Using A Single Tuned Real Gabor Filter Or A Bank Of Real Gabor Functions.en_HK
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License For Public Patent Documents-
dc.titleDefect Detection System For Quality Assurance Using Automated Visual Inspectionen_HK
dc.typePatenten_US
dc.identifier.emailPang, Grantham Kwok Hung:gpang@eee.hku.hken_US
dc.identifier.authorityPang, Grantham Kwok Hung=rp00162en_US
dc.description.naturepublished_or_final_version-
dc.identifier.hkuros90405en_US
dc.contributor.inventorKumar, Aen_US
dc.contributor.inventorPang, Kwok-hung Granthamen_US
patents.identifier.applicationUS 09/144588en_HK
patents.identifier.grantedUS 6753965en_HK
patents.description.assigneeUniv Hong Kong [Us]en_HK
patents.description.countryUnited States of Americaen_HK
patents.date.publication2003-05-01en_HK
patents.date.granted2004-06-22en_HK
dc.relation.referencesUS 5301129 (A) 1994-04-05en_HK
dc.relation.referencesUS 5774177 (A) 1998-06-30en_HK
dc.relation.referencesUS 4630304 (A) 1986-12-16en_HK
dc.relation.referencesUS 5737072 (A) 1998-04-07en_HK
dc.relation.referencesUS 5740048 (A) 1998-04-14en_HK
dc.relation.referencesUS 5825501 (A) 1998-10-20en_HK
dc.relation.referencesEP 0974831 (A2) 2000-01-26en_HK
dc.relation.referencesEP 0974831 (A3) 2000-03-22en_HK
dc.relation.referencesEP 0974831 (B1) 2005-01-12en_HK
patents.identifier.hkutechidEEE-2001-00045-1en_US
patents.date.application2001-10-25en_HK
patents.date.priority2001-10-25 US 09/144588en_HK
patents.date.priority2001-01-09 US 09/260520Pen_HK
patents.description.ccUSen_HK
patents.identifier.publicationUS 20030081215en_HK
patents.relation.familyUS 2003081215 (A1) 2003-05-01en_HK
patents.relation.familyUS 6753965 (B2) 2004-06-22en_HK
patents.description.kindB2en_HK
patents.typePatent_granteden_HK

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