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Conference Paper: A critical event processing framework over RFID-enabled manufacturing environment

TitleA critical event processing framework over RFID-enabled manufacturing environment
Authors
Fang, JHuang, GQZhang, YQu, T
Issue Date2010
Citation
The 20th International Conference on Flexible Automation and Intelligent Manufacturing (FAIM 2010), East Bay, CA., 12-14 July 2010. How to Cite?
DescriptionManufacturing Processes and Technology: No. 261
Persistent Identifierhttp://hdl.handle.net/10722/126222

 

DC FieldValueLanguage
dc.contributor.authorFang, Jen_HK
dc.contributor.authorHuang, GQen_HK
dc.contributor.authorZhang, Yen_HK
dc.contributor.authorQu, Ten_HK
dc.date.accessioned2010-10-31T12:16:29Z-
dc.date.available2010-10-31T12:16:29Z-
dc.date.issued2010en_HK
dc.identifier.citationThe 20th International Conference on Flexible Automation and Intelligent Manufacturing (FAIM 2010), East Bay, CA., 12-14 July 2010.en_HK
dc.identifier.urihttp://hdl.handle.net/10722/126222-
dc.descriptionManufacturing Processes and Technology: No. 261-
dc.languageengen_HK
dc.relation.ispartofInternational Conference on Flexible Automation and Intelligent Manufacturing, FAIM 2010-
dc.titleA critical event processing framework over RFID-enabled manufacturing environmenten_HK
dc.typeConference_Paperen_HK
dc.identifier.emailHuang, GQ: gqhuang@hkucc.hku.hken_HK
dc.identifier.emailZhang, Y: xjtuzyf@hku.hken_HK
dc.identifier.emailQu, T: quting@hku.hken_HK
dc.identifier.hkuros175688en_HK

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