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Title | Author(s) | Issue Date | |
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Comprehensive study of the statistical variability in a 22 nm fully depleted ultra-thin-body SOI MOSFET Journal:Solid-State Electronics | 2013 |
Title | Author(s) | Issue Date | |
---|---|---|---|
Comprehensive study of the statistical variability in a 22 nm fully depleted ultra-thin-body SOI MOSFET Journal:Solid-State Electronics | 2013 |