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Title | Author(s) | Issue Date | |
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Mechanisms for hot-carrier-induced degradation in reoxidized-nitrided-oxide n-MOSFET's under combined AC/DC stressing Journal:IEEE Transactions on Electron Devices | 1993 |
Title | Author(s) | Issue Date | |
---|---|---|---|
Mechanisms for hot-carrier-induced degradation in reoxidized-nitrided-oxide n-MOSFET's under combined AC/DC stressing Journal:IEEE Transactions on Electron Devices | 1993 |