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Are there long-run implications of analyst coverage for IPOs?Chan, K; Bradley, D; Kim, J; Singh, A2008195
High sensitivity 25 μm microbolometer FPAsMurphy, D; Ray, M; Wyles, R; Asbrock, J; Lum, N; Wyles, J; Hewitt, C; Kennedy, A; Van Lue, D; Anderson, J; Bradley, D; Chin, R; Kostrzewa, T200297
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