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Showing results 1 to 6 of 6

	Title	Author(s)	Issue Date	Views
	Definition and classification of power system stability Journal:IEEE Transactions on Power Systems	Kundur, P Paserba, J Ajjarapu, V Andersson, G Bose, A Canizares, C Hatziargyriou, N Hill, D Stankovic, A Taylor, C Van Cursem, T Vittal, V	2004	195
	Discussion of the solvability of HVDC systems power flow with a sequential method Journal:Electric Power Systems Research	Liu, C Bose, A Hou, Y	2012	39
	Genome-wide association study identifies FCGR2A as a susceptibility locus for Kawasaki disease Journal:Nature Genetics	Khor, CC Davila, S Breunis, WB Lee, YC Shimizu, C Wright, VJ Yeung, RSM Tan, DEK Sim, KS Wang, JJ Wong, TY Pang, J Mitchell, P Cimaz, R Dahdah, N Cheung, YF Huang, GY Yang, W Park, IS Lee, JK Wu, JY Levin, M Burns, JC Burgner, D Kuijpers, TW Hibberd, ML Lau, YL Zhang, J Ma, XJ Liu, F Wu, L Yoo, JJ Hong, SJ Kim, KJ Kim, JJ Park, YM Hong, YM Sohn, S Jang, GY Ha, KS Nam, HK Byeon, JH Yun, SW Han, MK Lee, KY Hwang, JY Rhim, JW Song, MS Lee, HD Kim, DS Lee, JM Chang, JS Tsai, FJ Liang, CD Chen, MR Chi, H Chiu, NC Huang, FY Chang, LY Huang, LM Kuo, HC Huang, KP Lee, ML Hwang, B Huang, YC Lee, PC Odam, M Christiansen, FT Witt, C Goldwater, P Curtis, N Palasanthiran, P Ziegler, J Nissen, M Nourse, C Kuipers, IM Ottenkamp, JJ Geissler, J Biezeveld, M Tacke, C Filippini, L Brogan, P Klein, N Shah, V Dillon, M Booy, R Shingadia, D Bose, A Mukasa, T Tulloh, R Michie, C Newburger, JW Baker, AL Rowley, AH Shulman, ST Mason, W Takahashi, M Melish, ME Tremoulet, AH Viswanathan, A Rochtchina, E Attia, J Scott, R Holliday, E Harrap, S	2011	233
	Localized reactive power markets using the concept of voltage control areas Proceeding/Conference:2006 IEEE Power Engineering Society General Meeting, PES	Zhong, J Nobile, E Bose, A Bhattacharya, K	2006	96
	Localized reactive power markets using the concept of voltage control areas Journal:IEEE Transactions on Power Systems	Zhong, J Nobile, E Bose, A Bhattacharya, K	2004
	Power system control centers: past, present, and future Journal:Proceedings of the IEEE	Wu, FF Moslehi, K Bose, A	2005	198

Showing results 1 to 6 of 6