Showing results 1 to 3 of 3
Title | Author(s) | Issue Date | |
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A mobility model correction for 'atomistic' drift-diffusion simulation Proceeding/Conference:International Conference on Simulation of Semiconductor Processes and Devices, SISPAD | 2011 | ||
Impact of random dopant fluctuations on trap-assisted tunnelling in nanoscale MOSFETs Journal:Microelectronics Reliability | 2012 | ||
Interplay between statistical reliability and variability: A comprehensive transistor-to-circuit simulation technology Proceeding/Conference:IEEE International Reliability Physics Symposium Proceedings | 2013 |