Showing results 2 to 6 of 6
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Title | Author(s) | Issue Date | |
---|---|---|---|
Deformation-induced transformations of nanocrystalline Ge-Si film during indentation Proceeding/Conference:Materials Research Society Symposium Proceedings | 2006 | ||
GIS-based Susceptibility Mapping: A Case Study Proceeding/Conference:Proceedings, Symposium on Slope Hazards and their Prevention | 2000 | ||
2002 | |||
TEM study of electron beam-induced crystallization of amorphous GeSi films Journal:Philosophical Magazine Letters | 2004 | ||
Visible photoluminescence of co-sputtered Ge-Si duplex nanocrystals Journal:Applied Physics A: Materials Science and Processing | 2005 |