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- Publisher Website: 10.1109/DELTA.2008.28
- Scopus: eid_2-s2.0-50649096825
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Conference Paper: Effects of insulator thickness on the sensing properties of MISiC Schottky-diode hydrogen sensor
Title | Effects of insulator thickness on the sensing properties of MISiC Schottky-diode hydrogen sensor |
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Authors | |
Issue Date | 2008 |
Citation | Proceedings - 4Th Ieee International Symposium On Electronic Design, Test And Applications, Delta 2008, 2008, p. 171-174 How to Cite? |
Abstract | Silicon dioxide deposited by RF sputtering is used as the gate insulator of Metal-Insulator-SiC (MISiC) Schottky-diode hydrogen sensors. Sensors with different gate insulator thicknesses are fabricated for investigation. Their hydrogen-sensing properties are compared with each other by taking measurements at various temperatures and hydrogen concentrations using a computer-controlled measurement system. Experimental results show that the sensitivity of the devices is strongly related to the thickness of the insulator, and the thicker the insulator, the higher is the sensitivity. © 2008 IEEE. |
Persistent Identifier | http://hdl.handle.net/10722/99445 |
References |
DC Field | Value | Language |
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dc.contributor.author | Tang, WM | en_HK |
dc.contributor.author | Leung, CH | en_HK |
dc.contributor.author | Lai, PT | en_HK |
dc.date.accessioned | 2010-09-25T18:30:32Z | - |
dc.date.available | 2010-09-25T18:30:32Z | - |
dc.date.issued | 2008 | en_HK |
dc.identifier.citation | Proceedings - 4Th Ieee International Symposium On Electronic Design, Test And Applications, Delta 2008, 2008, p. 171-174 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/99445 | - |
dc.description.abstract | Silicon dioxide deposited by RF sputtering is used as the gate insulator of Metal-Insulator-SiC (MISiC) Schottky-diode hydrogen sensors. Sensors with different gate insulator thicknesses are fabricated for investigation. Their hydrogen-sensing properties are compared with each other by taking measurements at various temperatures and hydrogen concentrations using a computer-controlled measurement system. Experimental results show that the sensitivity of the devices is strongly related to the thickness of the insulator, and the thicker the insulator, the higher is the sensitivity. © 2008 IEEE. | en_HK |
dc.language | eng | en_HK |
dc.relation.ispartof | Proceedings - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008 | en_HK |
dc.title | Effects of insulator thickness on the sensing properties of MISiC Schottky-diode hydrogen sensor | en_HK |
dc.type | Conference_Paper | en_HK |
dc.identifier.email | Leung, CH:chleung@eee.hku.hk | en_HK |
dc.identifier.email | Lai, PT:laip@eee.hku.hk | en_HK |
dc.identifier.authority | Leung, CH=rp00146 | en_HK |
dc.identifier.authority | Lai, PT=rp00130 | en_HK |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1109/DELTA.2008.28 | en_HK |
dc.identifier.scopus | eid_2-s2.0-50649096825 | en_HK |
dc.identifier.hkuros | 150360 | en_HK |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-50649096825&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.spage | 171 | en_HK |
dc.identifier.epage | 174 | en_HK |
dc.identifier.scopusauthorid | Tang, WM=24438163600 | en_HK |
dc.identifier.scopusauthorid | Leung, CH=7402612415 | en_HK |
dc.identifier.scopusauthorid | Lai, PT=7202946460 | en_HK |