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Conference Paper: CAVIS: A Low-cost Fabric Defect Inspection Machine based on Machine Vision

TitleCAVIS: A Low-cost Fabric Defect Inspection Machine based on Machine Vision
Authors
Issue Date2001
Persistent Identifierhttp://hdl.handle.net/10722/99069

 

DC FieldValueLanguage
dc.contributor.authorPang, GKHen_HK
dc.contributor.authorWong, RKHen_HK
dc.contributor.authorLiu, HSen_HK
dc.contributor.authorKwan, TOen_HK
dc.date.accessioned2010-09-25T18:14:34Z-
dc.date.available2010-09-25T18:14:34Z-
dc.date.issued2001en_HK
dc.identifier.urihttp://hdl.handle.net/10722/99069-
dc.languageengen_HK
dc.relation.ispartof6th Asian Textile Conference, Aug 22-24, 2001en_HK
dc.titleCAVIS: A Low-cost Fabric Defect Inspection Machine based on Machine Visionen_HK
dc.typeConference_Paperen_HK
dc.identifier.emailPang, GKH: gpang@eee.hku.hken_HK
dc.identifier.authorityPang, GKH=rp00162en_HK
dc.identifier.hkuros72438en_HK

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