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Conference Paper: A finite element - Analytical method for electromagnetic field analysis of electric machines with free rotation

TitleA finite element - Analytical method for electromagnetic field analysis of electric machines with free rotation
Authors
Issue Date2006
PublisherIEEE. The Journal's website is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000426
Citation
Intermag 2006 - IEEE International Magnetics Conference, San Diego, California, USA, 8-12 May 2006, p. 495, article no. ET-01 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/99005
References

 

DC FieldValueLanguage
dc.contributor.authorZhang, Yen_HK
dc.contributor.authorChau, Ken_HK
dc.contributor.authorJiang, Jen_HK
dc.contributor.authorZhang, Den_HK
dc.date.accessioned2010-09-25T18:11:51Z-
dc.date.available2010-09-25T18:11:51Z-
dc.date.issued2006en_HK
dc.identifier.citationIntermag 2006 - IEEE International Magnetics Conference, San Diego, California, USA, 8-12 May 2006, p. 495, article no. ET-01en_HK
dc.identifier.urihttp://hdl.handle.net/10722/99005-
dc.languageengen_HK
dc.publisherIEEE. The Journal's website is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000426-
dc.relation.ispartofINTERMAG 2006 - IEEE International Magnetics Conferenceen_HK
dc.rights©2006 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.-
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.titleA finite element - Analytical method for electromagnetic field analysis of electric machines with free rotationen_HK
dc.typeConference_Paperen_HK
dc.identifier.emailChau, K:ktchau@eee.hku.hken_HK
dc.identifier.authorityChau, K=rp00096en_HK
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1109/INTMAG.2006.376219en_HK
dc.identifier.scopuseid_2-s2.0-50249157052en_HK
dc.identifier.hkuros119030en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-50249157052&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.spage495en_HK
dc.identifier.epage495en_HK
dc.description.otherIntermag 2006 - IEEE International Magnetics Conference, San Diego, California, USA, 8-12 May 2006, p. 495, article no. ET-01-
dc.identifier.scopusauthoridZhang, Y=7601321142en_HK
dc.identifier.scopusauthoridChau, K=7202674641en_HK
dc.identifier.scopusauthoridJiang, J=7404829718en_HK
dc.identifier.scopusauthoridZhang, D=7405360802en_HK

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