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Conference Paper: Good Random Testing
Title | Good Random Testing |
---|---|
Authors | |
Issue Date | 2004 |
Citation | Proc. 9th Ada-Europe Int. Conf. on Reliable Software Technologies, p. 200-212 How to Cite? |
Persistent Identifier | http://hdl.handle.net/10722/93361 |
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chan, KP | en_HK |
dc.contributor.author | Chen, TY | en_HK |
dc.contributor.author | Towey, DP | en_HK |
dc.date.accessioned | 2010-09-25T14:58:46Z | - |
dc.date.available | 2010-09-25T14:58:46Z | - |
dc.date.issued | 2004 | en_HK |
dc.identifier.citation | Proc. 9th Ada-Europe Int. Conf. on Reliable Software Technologies, p. 200-212 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/93361 | - |
dc.language | eng | en_HK |
dc.relation.ispartof | Proc. 9th Ada-Europe Int. Conf. on Reliable Software Technologies | en_HK |
dc.title | Good Random Testing | en_HK |
dc.type | Conference_Paper | en_HK |
dc.identifier.email | Chan, KP: kpchan@cs.hku.hk | en_HK |
dc.identifier.email | Towey, DP: dptowey@cs.hku.hk | en_HK |
dc.identifier.authority | Chan, KP=rp00092 | en_HK |
dc.identifier.hkuros | 95320 | en_HK |
dc.identifier.spage | 200 | en_HK |
dc.identifier.epage | 212 | en_HK |