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Article: Unified equivalent circuit model of finite-ground microstrip line open-end discontinuities using MoM-SOC technique
Title | Unified equivalent circuit model of finite-ground microstrip line open-end discontinuities using MoM-SOC technique |
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Authors | |
Keywords | Equivalent circuit model Finite-ground microstrip line Method of moments Open-end discontinuity Short-open calibration procedure |
Issue Date | 2004 |
Publisher | Oxford University Press. The Journal's web site is located at http://ietele.oxfordjournals.org/ |
Citation | Ieice Transactions On Electronics, 2004, v. E87-C n. 5, p. 828-831 How to Cite? |
Abstract | Finite-ground microstrip line (FGMSL) open-end discontinuities are characterized via a self-calibrated method of moments (MoM) as a unified circuit model with a fringing capacitance and radiation conductance. By integrating the short-open calibration (SOC) procedure into a determinant MoM, the model parameters are extracted without needing the alternative port impedance. Regardless of non-ideal voltage sources, extracted parameters are observed to achieve a stable convergence as the feeding line is sufficiently extended. After extracted capacitance of a FGMSL open-end with equal strip and finite-ground widths are validated against its traditional MSL counterpart with infinite ground, extensive results are given to originally demonstrate that the capacitance increases as a decelerated function of the finite-ground width and length while the conductance is negligibly small as compared with its imaginary part. |
Persistent Identifier | http://hdl.handle.net/10722/92872 |
ISSN | 2023 Impact Factor: 0.6 2023 SCImago Journal Rankings: 0.208 |
References |
DC Field | Value | Language |
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dc.contributor.author | Sun, S | en_HK |
dc.contributor.author | Zhu, L | en_HK |
dc.date.accessioned | 2010-09-22T05:02:11Z | - |
dc.date.available | 2010-09-22T05:02:11Z | - |
dc.date.issued | 2004 | en_HK |
dc.identifier.citation | Ieice Transactions On Electronics, 2004, v. E87-C n. 5, p. 828-831 | en_HK |
dc.identifier.issn | 0916-8524 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/92872 | - |
dc.description.abstract | Finite-ground microstrip line (FGMSL) open-end discontinuities are characterized via a self-calibrated method of moments (MoM) as a unified circuit model with a fringing capacitance and radiation conductance. By integrating the short-open calibration (SOC) procedure into a determinant MoM, the model parameters are extracted without needing the alternative port impedance. Regardless of non-ideal voltage sources, extracted parameters are observed to achieve a stable convergence as the feeding line is sufficiently extended. After extracted capacitance of a FGMSL open-end with equal strip and finite-ground widths are validated against its traditional MSL counterpart with infinite ground, extensive results are given to originally demonstrate that the capacitance increases as a decelerated function of the finite-ground width and length while the conductance is negligibly small as compared with its imaginary part. | en_HK |
dc.language | eng | en_HK |
dc.publisher | Oxford University Press. The Journal's web site is located at http://ietele.oxfordjournals.org/ | en_HK |
dc.relation.ispartof | IEICE Transactions on Electronics | en_HK |
dc.subject | Equivalent circuit model | en_HK |
dc.subject | Finite-ground microstrip line | en_HK |
dc.subject | Method of moments | en_HK |
dc.subject | Open-end discontinuity | en_HK |
dc.subject | Short-open calibration procedure | en_HK |
dc.title | Unified equivalent circuit model of finite-ground microstrip line open-end discontinuities using MoM-SOC technique | en_HK |
dc.type | Article | en_HK |
dc.identifier.email | Sun, S:sunsheng@hku.hk | en_HK |
dc.identifier.authority | Sun, S=rp01431 | en_HK |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.scopus | eid_2-s2.0-2642553969 | en_HK |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-2642553969&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | E87-C | en_HK |
dc.identifier.issue | 5 | en_HK |
dc.identifier.spage | 828 | en_HK |
dc.identifier.epage | 831 | en_HK |
dc.publisher.place | United Kingdom | en_HK |
dc.identifier.scopusauthorid | Sun, S=7404509453 | en_HK |
dc.identifier.scopusauthorid | Zhu, L=7404201926 | en_HK |
dc.identifier.issnl | 0916-8524 | - |