File Download

There are no files associated with this item.

  Links for fulltext
     (May Require Subscription)
Supplementary

Article: Numerical deembedding technique for planar discontinuities with periodically nonuniform feed lines

TitleNumerical deembedding technique for planar discontinuities with periodically nonuniform feed lines
Authors
KeywordsDeembedding
Method of moments
Periodically nonuniform feed line
Planar discontinuity
Short-open calibration technique
Issue Date2008
PublisherJohn Wiley & Sons, Inc. The Journal's web site is located at http://www3.interscience.wiley.com/cgi-bin/jhome/39041
Citation
International Journal Of Rf And Microwave Computer-Aided Engineering, 2008, v. 18 n. 5, p. 496-504 How to Cite?
AbstractA numerical short-open calibration technique is applied to deembedding of planar discontinuities with periodically perturbed nonuniform feed lines in the full-wave method of moments (MoM) algorithm. Different from the other deembedding techniques that are based on the assumption of uniform feed lines, this proposed technique exhibits an unparalleled capability on modeling of planar circuits with nonuniform feed lines. To demonstrate this feature, the open and gap discontinuities are modeled under periodically nonuniform feed configuration, and the effective per-unit-length transmission parameters of slow-wave and electromagnetic bandgap structures are extracted from the full-wave MoM simulation. Two periodically nonuniform microstrip-line resonator circuits are modeled and then confirmed by EM simulators and measurement. © 2008 Wiley Periodicals, Inc.
Persistent Identifierhttp://hdl.handle.net/10722/92862
ISSN
2015 Impact Factor: 0.524
2015 SCImago Journal Rankings: 0.285
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorSun, Sen_HK
dc.contributor.authorZhu, Len_HK
dc.date.accessioned2010-09-22T05:01:53Z-
dc.date.available2010-09-22T05:01:53Z-
dc.date.issued2008en_HK
dc.identifier.citationInternational Journal Of Rf And Microwave Computer-Aided Engineering, 2008, v. 18 n. 5, p. 496-504en_HK
dc.identifier.issn1096-4290en_HK
dc.identifier.urihttp://hdl.handle.net/10722/92862-
dc.description.abstractA numerical short-open calibration technique is applied to deembedding of planar discontinuities with periodically perturbed nonuniform feed lines in the full-wave method of moments (MoM) algorithm. Different from the other deembedding techniques that are based on the assumption of uniform feed lines, this proposed technique exhibits an unparalleled capability on modeling of planar circuits with nonuniform feed lines. To demonstrate this feature, the open and gap discontinuities are modeled under periodically nonuniform feed configuration, and the effective per-unit-length transmission parameters of slow-wave and electromagnetic bandgap structures are extracted from the full-wave MoM simulation. Two periodically nonuniform microstrip-line resonator circuits are modeled and then confirmed by EM simulators and measurement. © 2008 Wiley Periodicals, Inc.en_HK
dc.languageengen_HK
dc.publisherJohn Wiley & Sons, Inc. The Journal's web site is located at http://www3.interscience.wiley.com/cgi-bin/jhome/39041en_HK
dc.relation.ispartofInternational Journal of RF and Microwave Computer-Aided Engineeringen_HK
dc.subjectDeembeddingen_HK
dc.subjectMethod of momentsen_HK
dc.subjectPeriodically nonuniform feed lineen_HK
dc.subjectPlanar discontinuityen_HK
dc.subjectShort-open calibration techniqueen_HK
dc.titleNumerical deembedding technique for planar discontinuities with periodically nonuniform feed linesen_HK
dc.typeArticleen_HK
dc.identifier.emailSun, S:sunsheng@hku.hken_HK
dc.identifier.authoritySun, S=rp01431en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1002/mmce.20312en_HK
dc.identifier.scopuseid_2-s2.0-51449087123en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-51449087123&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume18en_HK
dc.identifier.issue5en_HK
dc.identifier.spage496en_HK
dc.identifier.epage504en_HK
dc.identifier.eissn1099-047X-
dc.identifier.isiWOS:000258856800012-
dc.publisher.placeUnited Statesen_HK
dc.identifier.scopusauthoridSun, S=7404509453en_HK
dc.identifier.scopusauthoridZhu, L=7404201926en_HK

Export via OAI-PMH Interface in XML Formats


OR


Export to Other Non-XML Formats