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Conference Paper: Short-open calibration technique for field theory-based parametric extraction of planar discontinuities with nonuniform feed lines

TitleShort-open calibration technique for field theory-based parametric extraction of planar discontinuities with nonuniform feed lines
Authors
KeywordsMethod of moments
Nonuniform feed line
Numerical deembedding
Planar discontinuity
Short-open calibration technique
Issue Date2007
PublisherI E E E. The Journal's web site is located at http://www.ims2006.org
Citation
Ieee Mtt-S International Microwave Symposium Digest, 2007, p. 273-276 How to Cite?
AbstractIn this work, a short-open calibration technique is extended for field theory-based parametric extraction of planar discontinuities with nonuniform feed lines in the platform of full-wave method-of-moments. As a planar discontinuity is analyzed with respect to the planes of impressed sources, each individual nonuniform feed line is modeled as a general error box relying on the perfect short- and open-circuit standards. By calibrating out all the error boxes associated with all the nonuniform feed lines, the core discontinuity section can be deembedded based on the cascaded network theorem. Since each individual feed line is modeled as a unified two-port circuit instead of a transmission line section, the presented technique provides an advantageous feature in deembedding various planar circuits that may be fed by nonuniform lines, as met in the high-density and high-integrated circuits. After theoretical description is made on the deembedding procedure, a microstrip-line slit discontinuity with varied feed lines is numerically characterized. Extracted equivalent circuit parameters are at first confirmed by the Sonnet em simulator in the uniform case and then substantially demonstrated in various nonuniform cases. © 2007 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/92856
ISSN
References

 

DC FieldValueLanguage
dc.contributor.authorSun, Sen_HK
dc.contributor.authorZhu, Len_HK
dc.date.accessioned2010-09-22T05:01:42Z-
dc.date.available2010-09-22T05:01:42Z-
dc.date.issued2007en_HK
dc.identifier.citationIeee Mtt-S International Microwave Symposium Digest, 2007, p. 273-276en_HK
dc.identifier.issn0149-645Xen_HK
dc.identifier.urihttp://hdl.handle.net/10722/92856-
dc.description.abstractIn this work, a short-open calibration technique is extended for field theory-based parametric extraction of planar discontinuities with nonuniform feed lines in the platform of full-wave method-of-moments. As a planar discontinuity is analyzed with respect to the planes of impressed sources, each individual nonuniform feed line is modeled as a general error box relying on the perfect short- and open-circuit standards. By calibrating out all the error boxes associated with all the nonuniform feed lines, the core discontinuity section can be deembedded based on the cascaded network theorem. Since each individual feed line is modeled as a unified two-port circuit instead of a transmission line section, the presented technique provides an advantageous feature in deembedding various planar circuits that may be fed by nonuniform lines, as met in the high-density and high-integrated circuits. After theoretical description is made on the deembedding procedure, a microstrip-line slit discontinuity with varied feed lines is numerically characterized. Extracted equivalent circuit parameters are at first confirmed by the Sonnet em simulator in the uniform case and then substantially demonstrated in various nonuniform cases. © 2007 IEEE.en_HK
dc.languageengen_HK
dc.publisherI E E E. The Journal's web site is located at http://www.ims2006.orgen_HK
dc.relation.ispartofIEEE MTT-S International Microwave Symposium Digesten_HK
dc.subjectMethod of momentsen_HK
dc.subjectNonuniform feed lineen_HK
dc.subjectNumerical deembeddingen_HK
dc.subjectPlanar discontinuityen_HK
dc.subjectShort-open calibration techniqueen_HK
dc.titleShort-open calibration technique for field theory-based parametric extraction of planar discontinuities with nonuniform feed linesen_HK
dc.typeConference_Paperen_HK
dc.identifier.emailSun, S:sunsheng@hku.hken_HK
dc.identifier.authoritySun, S=rp01431en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1109/MWSYM.2007.380403en_HK
dc.identifier.scopuseid_2-s2.0-34748846982en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-34748846982&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.spage273en_HK
dc.identifier.epage276en_HK
dc.publisher.placeUnited Statesen_HK
dc.identifier.scopusauthoridSun, S=7404509453en_HK
dc.identifier.scopusauthoridZhu, L=7404201926en_HK

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