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Article: Enhancement of broadband performance for on-chip spiral inductors with inner-patterned-ground

TitleEnhancement of broadband performance for on-chip spiral inductors with inner-patterned-ground
Authors
KeywordsCMOS
Inner-patterned-ground
On-chip spiral inductor
Quality factor
Issue Date2008
PublisherJohn Wiley & Sons, Inc. The Journal's web site is located at http://www3.interscience.wiley.com/cgi-bin/jhome/37176
Citation
Microwave And Optical Technology Letters, 2008, v. 50 n. 7, p. 1744-1746 How to Cite?
AbstractA set of on-chip spiral inductors with novel inner-patterned-ground (IPG) is presented in this article to enhance the broadband performance. By grounding the simple center metal cross, the IPG structure, an additional inner ground path is formed, the input impedance of the spiral inductor is reduced at the higher frequency range. When compared with conventional inductors, the quality factor (Q) of the IPG inductors increases by 15-30% over the frequency range of 15-35 GHz. The IPG inductors can be modeled based on a simple lumped equivalent circuit. The extracted inductance and quality factors are verified by on-wafer measurement up to 50 GHz. © 2008 Wiley Periodicals, Inc.
Persistent Identifierhttp://hdl.handle.net/10722/92844
ISSN
2015 Impact Factor: 0.545
2015 SCImago Journal Rankings: 0.372
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorShi, Jen_HK
dc.contributor.authorXiong, YZen_HK
dc.contributor.authorYeoh, WGen_HK
dc.contributor.authorSun, Sen_HK
dc.contributor.authorYeo, KSen_HK
dc.date.accessioned2010-09-22T05:01:19Z-
dc.date.available2010-09-22T05:01:19Z-
dc.date.issued2008en_HK
dc.identifier.citationMicrowave And Optical Technology Letters, 2008, v. 50 n. 7, p. 1744-1746en_HK
dc.identifier.issn0895-2477en_HK
dc.identifier.urihttp://hdl.handle.net/10722/92844-
dc.description.abstractA set of on-chip spiral inductors with novel inner-patterned-ground (IPG) is presented in this article to enhance the broadband performance. By grounding the simple center metal cross, the IPG structure, an additional inner ground path is formed, the input impedance of the spiral inductor is reduced at the higher frequency range. When compared with conventional inductors, the quality factor (Q) of the IPG inductors increases by 15-30% over the frequency range of 15-35 GHz. The IPG inductors can be modeled based on a simple lumped equivalent circuit. The extracted inductance and quality factors are verified by on-wafer measurement up to 50 GHz. © 2008 Wiley Periodicals, Inc.en_HK
dc.languageengen_HK
dc.publisherJohn Wiley & Sons, Inc. The Journal's web site is located at http://www3.interscience.wiley.com/cgi-bin/jhome/37176en_HK
dc.relation.ispartofMicrowave and Optical Technology Lettersen_HK
dc.subjectCMOSen_HK
dc.subjectInner-patterned-grounden_HK
dc.subjectOn-chip spiral inductoren_HK
dc.subjectQuality factoren_HK
dc.titleEnhancement of broadband performance for on-chip spiral inductors with inner-patterned-grounden_HK
dc.typeArticleen_HK
dc.identifier.emailSun, S:sunsheng@hku.hken_HK
dc.identifier.authoritySun, S=rp01431en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1002/mop.23545en_HK
dc.identifier.scopuseid_2-s2.0-45249107268en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-45249107268&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume50en_HK
dc.identifier.issue7en_HK
dc.identifier.spage1744en_HK
dc.identifier.epage1746en_HK
dc.identifier.isiWOS:000255803300010-
dc.publisher.placeUnited Statesen_HK
dc.identifier.scopusauthoridShi, J=7404494665en_HK
dc.identifier.scopusauthoridXiong, YZ=7402194345en_HK
dc.identifier.scopusauthoridYeoh, WG=6506671449en_HK
dc.identifier.scopusauthoridSun, S=7404509453en_HK
dc.identifier.scopusauthoridYeo, KS=22636211100en_HK

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