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Article: Effects of trace amount addition of rare earth on properties and microstructure of Sn-Ag-Cu alloys
Title | Effects of trace amount addition of rare earth on properties and microstructure of Sn-Ag-Cu alloys | ||||||||
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Authors | |||||||||
Keywords | Alloys Cerium Cerium Alloys Cerium Compounds Copper Alloys Lead Lead Compounds Mechanical Properties Metal Refining Microstructure Phase Interfaces Rare Earths Scanning Electron Microscopy Semiconducting Intermetallics Silver Silver Alloys Soldering Alloys Tensile Strength Tin Alloys Trace Analysis | ||||||||
Issue Date | 2009 | ||||||||
Publisher | Springer New York LLC. The Journal's web site is located at http://springerlink.metapress.com/openurl.asp?genre=journal&issn=0957-4522 | ||||||||
Citation | Journal of Materials Science: Materials in Electronics, 2009, v. 20 n. 12, p. 1193-1199 How to Cite? | ||||||||
Abstract | Ternary lead free solder alloys Sn-Ag-Cu were considered as the promising alternatives to conventional SnPb alloys comparing with other solders. In the present work, effects of trace amounts of rare earth Ce on the wettability, mechanical properties and microstructure of Sn-Ag-Cu solder have been investigated by means of scanning electron microscopy and energy dispersive X-ray analysis systematically. The results indicate that adding trace amount of rare earth Ce can remarkably improve the wettability, mechanical strength of Sn-Ag-Cu solder joint at different temperature, especially when the content of rare earth Ce is at about 0.03%, the tensile strength will be 110% times or more than that of the lead free solder joint without rare earth Ce addition. Moreover, it was observed that the trace amount of rare earth Ce in Sn-Ag-Cu solder may refine the joint matrix microstructure, modify the Cu6Sn5 intermetallic phase at the copper substrate/ solder interface, and the intermetallic compound layer thickness was reduced significantly. In addition, since rare earth Ce possesses a higher affinity to Sn in the alloy, adding of rare earth Ce can also lead to the delayed formation and growth of the intermetallic compounds of Ag3Sn and Cu6Sn5 in the alloy. © Springer Science+Business Media, LLC 2009. | ||||||||
Persistent Identifier | http://hdl.handle.net/10722/92028 | ||||||||
ISSN | 2023 Impact Factor: 2.8 2023 SCImago Journal Rankings: 0.512 | ||||||||
ISI Accession Number ID |
Funding Information: The authors greatly appreciate the financial support from the Six Kind Skilled Personnel Project of Jiangsu Province (CX07B_087z), the Jiangsu General Colleges and Universities Postgraduate Scientific Research Innovative Plan (CX07B_087z), and Nanjing University of Aeronautics and Astronautics Undergraduate Scientific Research Innovative. | ||||||||
References |
DC Field | Value | Language |
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dc.contributor.author | Zhang, L | en_HK |
dc.contributor.author | Xue, S-B | en_HK |
dc.contributor.author | Gao, L-L | en_HK |
dc.contributor.author | Chen, Y | en_HK |
dc.contributor.author | Yu, S-L | en_HK |
dc.contributor.author | Sheng, Z | en_HK |
dc.contributor.author | Zeng, G | en_HK |
dc.date.accessioned | 2010-09-17T10:33:57Z | - |
dc.date.available | 2010-09-17T10:33:57Z | - |
dc.date.issued | 2009 | en_HK |
dc.identifier.citation | Journal of Materials Science: Materials in Electronics, 2009, v. 20 n. 12, p. 1193-1199 | en_HK |
dc.identifier.issn | 0957-4522 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/92028 | - |
dc.description.abstract | Ternary lead free solder alloys Sn-Ag-Cu were considered as the promising alternatives to conventional SnPb alloys comparing with other solders. In the present work, effects of trace amounts of rare earth Ce on the wettability, mechanical properties and microstructure of Sn-Ag-Cu solder have been investigated by means of scanning electron microscopy and energy dispersive X-ray analysis systematically. The results indicate that adding trace amount of rare earth Ce can remarkably improve the wettability, mechanical strength of Sn-Ag-Cu solder joint at different temperature, especially when the content of rare earth Ce is at about 0.03%, the tensile strength will be 110% times or more than that of the lead free solder joint without rare earth Ce addition. Moreover, it was observed that the trace amount of rare earth Ce in Sn-Ag-Cu solder may refine the joint matrix microstructure, modify the Cu6Sn5 intermetallic phase at the copper substrate/ solder interface, and the intermetallic compound layer thickness was reduced significantly. In addition, since rare earth Ce possesses a higher affinity to Sn in the alloy, adding of rare earth Ce can also lead to the delayed formation and growth of the intermetallic compounds of Ag3Sn and Cu6Sn5 in the alloy. © Springer Science+Business Media, LLC 2009. | en_HK |
dc.language | eng | en_HK |
dc.publisher | Springer New York LLC. The Journal's web site is located at http://springerlink.metapress.com/openurl.asp?genre=journal&issn=0957-4522 | en_HK |
dc.relation.ispartof | Journal of Materials Science: Materials in Electronics | en_HK |
dc.subject | Alloys | en_HK |
dc.subject | Cerium | en_HK |
dc.subject | Cerium Alloys | en_HK |
dc.subject | Cerium Compounds | en_HK |
dc.subject | Copper Alloys | en_HK |
dc.subject | Lead | en_HK |
dc.subject | Lead Compounds | en_HK |
dc.subject | Mechanical Properties | en_HK |
dc.subject | Metal Refining | en_HK |
dc.subject | Microstructure | en_HK |
dc.subject | Phase Interfaces | en_HK |
dc.subject | Rare Earths | en_HK |
dc.subject | Scanning Electron Microscopy | en_HK |
dc.subject | Semiconducting Intermetallics | en_HK |
dc.subject | Silver | en_HK |
dc.subject | Silver Alloys | en_HK |
dc.subject | Soldering Alloys | en_HK |
dc.subject | Tensile Strength | en_HK |
dc.subject | Tin Alloys | en_HK |
dc.subject | Trace Analysis | en_HK |
dc.title | Effects of trace amount addition of rare earth on properties and microstructure of Sn-Ag-Cu alloys | en_HK |
dc.type | Article | en_HK |
dc.identifier.email | Chen, Y:ychenc@hkucc.hku.hk | en_HK |
dc.identifier.authority | Chen, Y=rp1318 | en_HK |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1007/s10854-008-9850-7 | en_HK |
dc.identifier.scopus | eid_2-s2.0-70350336742 | en_HK |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-70350336742&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 20 | en_HK |
dc.identifier.issue | 12 | en_HK |
dc.identifier.spage | 1193 | en_HK |
dc.identifier.epage | 1199 | en_HK |
dc.identifier.eissn | 1573-482X | - |
dc.identifier.isi | WOS:000270780500007 | - |
dc.identifier.citeulike | 3942626 | - |
dc.identifier.issnl | 0957-4522 | - |