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Article: A note on tests for positive-real functions

TitleA note on tests for positive-real functions
Authors
Chen, MZQSmith, MC
KeywordsElectric circuits
Mechanical networks
Network synthesis
Passivity
Issue Date2009
PublisherIEEE
Citation
Ieee Transactions On Automatic Control, 2009, v. 54 n. 2, p. 390-393 How to Cite?
DOI: http://dx.doi.org/10.1109/TAC.2008.2008351
AbstractThis technical note presents a modified test for positive-realness of scalar real-rational functions which avoids the need to test residue conditions. Necessary and sufficient conditions for the positive-realness of some classes of low-order real-rational functions are given by making use of the modified test. © 2009 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/91406
ISSN
0018-9286
2023 Impact Factor: 6.2
2023 SCImago Journal Rankings: 4.501
ISI Accession Number ID
WOS:000263567000022
References
References in Scopus

 

DC FieldValueLanguage
dc.contributor.authorChen, MZQen_HK
dc.contributor.authorSmith, MCen_HK
dc.date.accessioned2010-09-17T10:18:46Z-
dc.date.available2010-09-17T10:18:46Z-
dc.date.issued2009en_HK
dc.identifier.citationIeee Transactions On Automatic Control, 2009, v. 54 n. 2, p. 390-393en_HK
dc.identifier.issn0018-9286en_HK
dc.identifier.urihttp://hdl.handle.net/10722/91406-
dc.description.abstractThis technical note presents a modified test for positive-realness of scalar real-rational functions which avoids the need to test residue conditions. Necessary and sufficient conditions for the positive-realness of some classes of low-order real-rational functions are given by making use of the modified test. © 2009 IEEE.en_HK
dc.languageengen_HK
dc.publisherIEEEen_HK
dc.relation.ispartofIEEE Transactions on Automatic Controlen_HK
dc.subjectElectric circuitsen_HK
dc.subjectMechanical networksen_HK
dc.subjectNetwork synthesisen_HK
dc.subjectPassivityen_HK
dc.titleA note on tests for positive-real functionsen_HK
dc.typeArticleen_HK
dc.identifier.emailChen, MZQ:mzqchen@hku.hken_HK
dc.identifier.authorityChen, MZQ=rp01317en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1109/TAC.2008.2008351en_HK
dc.identifier.scopuseid_2-s2.0-61349102572en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-61349102572&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume54en_HK
dc.identifier.issue2en_HK
dc.identifier.spage390en_HK
dc.identifier.epage393en_HK
dc.identifier.isiWOS:000263567000022-
dc.publisher.placeUnited Statesen_HK
dc.identifier.scopusauthoridChen, MZQ=35085827300en_HK
dc.identifier.scopusauthoridSmith, MC=8913869300en_HK
dc.identifier.issnl0018-9286-

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