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Article: Electron capture characteristic of trap in PET film under high electrical strength

TitleElectron capture characteristic of trap in PET film under high electrical strength
Authors
KeywordsPlastics Films--Electric Properties
Issue Date1992
Citation
Hsi-An Chiao Tung Ta Hsueh/Journal Of Xi'an Jiaotong University, 1992, v. 26 n. 2, p. 49-54 How to Cite?
AbstractThe dynamic properties of electron capture of traps in solid dielectrics under high electrical strength were studied with the surface potential measurement by the authors. A first-order dynamic equation of trapping was derived by considering the detrapping of electrons caused by collision ionization. The theory can qualitatively explain the time characteristic of trapped electrons and the reduction of steady-state values of trapped electrons with electrical strength increasing. The test results confirmed the theoretical analysis. It was shown that the decreasing of the steady-state value was caused by detrapping due to electron collision ionization between the free electrons and the trapped ones rather than by tunnel effect or Poole-Frenkel effect of trapped electrons as usually thought. When the detrapping due to collision ionization reaches a certain degree with the applied electrical strength increasing, the electrical breakdown of dielectrics occurs.
Persistent Identifierhttp://hdl.handle.net/10722/91405
ISSN
2015 SCImago Journal Rankings: 0.246

 

DC FieldValueLanguage
dc.contributor.authorLiu, Fudeen_HK
dc.contributor.authorTu, Deminen_HK
dc.contributor.authorLiu, Yaonanen_HK
dc.date.accessioned2010-09-17T10:18:45Z-
dc.date.available2010-09-17T10:18:45Z-
dc.date.issued1992en_HK
dc.identifier.citationHsi-An Chiao Tung Ta Hsueh/Journal Of Xi'an Jiaotong University, 1992, v. 26 n. 2, p. 49-54en_HK
dc.identifier.issn0253-987Xen_HK
dc.identifier.urihttp://hdl.handle.net/10722/91405-
dc.description.abstractThe dynamic properties of electron capture of traps in solid dielectrics under high electrical strength were studied with the surface potential measurement by the authors. A first-order dynamic equation of trapping was derived by considering the detrapping of electrons caused by collision ionization. The theory can qualitatively explain the time characteristic of trapped electrons and the reduction of steady-state values of trapped electrons with electrical strength increasing. The test results confirmed the theoretical analysis. It was shown that the decreasing of the steady-state value was caused by detrapping due to electron collision ionization between the free electrons and the trapped ones rather than by tunnel effect or Poole-Frenkel effect of trapped electrons as usually thought. When the detrapping due to collision ionization reaches a certain degree with the applied electrical strength increasing, the electrical breakdown of dielectrics occurs.en_HK
dc.languageengen_HK
dc.relation.ispartofHsi-An Chiao Tung Ta Hsueh/Journal of Xi'an Jiaotong Universityen_HK
dc.subjectPlastics Films--Electric Propertiesen_HK
dc.titleElectron capture characteristic of trap in PET film under high electrical strengthen_HK
dc.typeArticleen_HK
dc.identifier.emailLiu, Fude:fordliu@hku.hken_HK
dc.identifier.authorityLiu, Fude=rp01358en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.scopuseid_2-s2.0-0026850434en_HK
dc.identifier.volume26en_HK
dc.identifier.issue2en_HK
dc.identifier.spage49en_HK
dc.identifier.epage54en_HK
dc.identifier.scopusauthoridLiu, Fude=11038795100en_HK
dc.identifier.scopusauthoridTu, Demin=7005168658en_HK
dc.identifier.scopusauthoridLiu, Yaonan=7410221739en_HK

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