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Conference Paper: Stress-induced χ(2) in silicon - Comparison between theoretical and experimental values

TitleStress-induced χ(2) in silicon - Comparison between theoretical and experimental values
Authors
Issue Date2009
Citation
Ieee International Conference On Group Iv Photonics Gfp, 2009, p. 232-234 How to Cite?
AbstractWe provide a new theoretical estimation of stressinduced χ(2) in silicon and highlight the fact that there exists a large difference between theoretical and experimentally measured values. Possible reasons for this discrepancy are discussed. © 2009 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/91335
ISSN
References

 

DC FieldValueLanguage
dc.contributor.authorHon, NKen_HK
dc.contributor.authorTsia, KKen_HK
dc.contributor.authorSolli, DRen_HK
dc.contributor.authorJalali, Ben_HK
dc.contributor.authorKhurgin, JBen_HK
dc.date.accessioned2010-09-17T10:17:14Z-
dc.date.available2010-09-17T10:17:14Z-
dc.date.issued2009en_HK
dc.identifier.citationIeee International Conference On Group Iv Photonics Gfp, 2009, p. 232-234en_HK
dc.identifier.issn1949-2081en_HK
dc.identifier.urihttp://hdl.handle.net/10722/91335-
dc.description.abstractWe provide a new theoretical estimation of stressinduced χ(2) in silicon and highlight the fact that there exists a large difference between theoretical and experimentally measured values. Possible reasons for this discrepancy are discussed. © 2009 IEEE.en_HK
dc.languageengen_HK
dc.relation.ispartofIEEE International Conference on Group IV Photonics GFPen_HK
dc.titleStress-induced χ(2) in silicon - Comparison between theoretical and experimental valuesen_HK
dc.typeConference_Paperen_HK
dc.identifier.emailTsia, KK:tsia@hku.hken_HK
dc.identifier.authorityTsia, KK=rp01389en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1109/GROUP4.2009.5338380en_HK
dc.identifier.scopuseid_2-s2.0-77951026795en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-77951026795&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.spage232en_HK
dc.identifier.epage234en_HK
dc.identifier.scopusauthoridHon, NK=16312604600en_HK
dc.identifier.scopusauthoridTsia, KK=6506659574en_HK
dc.identifier.scopusauthoridSolli, DR=6701800544en_HK
dc.identifier.scopusauthoridJalali, B=7004889917en_HK
dc.identifier.scopusauthoridKhurgin, JB=7006097384en_HK

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