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- Publisher Website: 10.1109/3DIC.2009.5306525
- Scopus: eid_2-s2.0-70549098155
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Conference Paper: Electrical-thermal co-analysis for power delivery networks in 3D system integration
Title | Electrical-thermal co-analysis for power delivery networks in 3D system integration |
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Authors | |
Keywords | 3D integration Electrical-thermal co-anlysis IR drop Joule heating Power delivery network (PDN) Temperature effect Through-silicon via (TSV) |
Issue Date | 2009 |
Citation | 2009 Ieee International Conference On 3D System Integration, 3Dic 2009, 2009 How to Cite? |
Abstract | In this paper, an electrical-thermal co-analysis method for power delivery networks in 3D system integration is proposed. For electrical analysis, temperature-dependent electrical resistivity of conductors is taken into account. For thermal analysis, Joule heating effect due to the current flowing through conductors is considered. The proposed co-analysis method is carried out using Rgen and ChipJoule of IBM EIP Tool Suite. An example of 3D integration system including stacked chips, power delivery network, glass-ceramic substrate, through-silicon vias, controlled collapse chip connections (C4s), underfill material, and TIM is analyzed using the proposed method. The simulation results show that the temperature effect on IR drop can not be neglected. The error of not considering thermal effect on IR drop is about 20% in the example. © 2009 IEEE. |
Persistent Identifier | http://hdl.handle.net/10722/91320 |
References |
DC Field | Value | Language |
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dc.contributor.author | Xie, J | en_HK |
dc.contributor.author | Chung, D | en_HK |
dc.contributor.author | Swaminathan, M | en_HK |
dc.contributor.author | Mcallister, M | en_HK |
dc.contributor.author | Deutsch, A | en_HK |
dc.contributor.author | Jiang, L | en_HK |
dc.contributor.author | Rubin, BJ | en_HK |
dc.date.accessioned | 2010-09-17T10:16:59Z | - |
dc.date.available | 2010-09-17T10:16:59Z | - |
dc.date.issued | 2009 | en_HK |
dc.identifier.citation | 2009 Ieee International Conference On 3D System Integration, 3Dic 2009, 2009 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/91320 | - |
dc.description.abstract | In this paper, an electrical-thermal co-analysis method for power delivery networks in 3D system integration is proposed. For electrical analysis, temperature-dependent electrical resistivity of conductors is taken into account. For thermal analysis, Joule heating effect due to the current flowing through conductors is considered. The proposed co-analysis method is carried out using Rgen and ChipJoule of IBM EIP Tool Suite. An example of 3D integration system including stacked chips, power delivery network, glass-ceramic substrate, through-silicon vias, controlled collapse chip connections (C4s), underfill material, and TIM is analyzed using the proposed method. The simulation results show that the temperature effect on IR drop can not be neglected. The error of not considering thermal effect on IR drop is about 20% in the example. © 2009 IEEE. | en_HK |
dc.language | eng | en_HK |
dc.relation.ispartof | 2009 IEEE International Conference on 3D System Integration, 3DIC 2009 | en_HK |
dc.subject | 3D integration | en_HK |
dc.subject | Electrical-thermal co-anlysis | en_HK |
dc.subject | IR drop | en_HK |
dc.subject | Joule heating | en_HK |
dc.subject | Power delivery network (PDN) | en_HK |
dc.subject | Temperature effect | en_HK |
dc.subject | Through-silicon via (TSV) | en_HK |
dc.title | Electrical-thermal co-analysis for power delivery networks in 3D system integration | en_HK |
dc.type | Conference_Paper | en_HK |
dc.identifier.email | Jiang, L:ljiang@eee.hku.hk | en_HK |
dc.identifier.authority | Jiang, L=rp01338 | en_HK |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1109/3DIC.2009.5306525 | en_HK |
dc.identifier.scopus | eid_2-s2.0-70549098155 | en_HK |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-70549098155&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.scopusauthorid | Xie, J=7402994229 | en_HK |
dc.identifier.scopusauthorid | Chung, D=9533916800 | en_HK |
dc.identifier.scopusauthorid | Swaminathan, M=7103353366 | en_HK |
dc.identifier.scopusauthorid | Mcallister, M=7102448103 | en_HK |
dc.identifier.scopusauthorid | Deutsch, A=7102025083 | en_HK |
dc.identifier.scopusauthorid | Jiang, L=36077777200 | en_HK |
dc.identifier.scopusauthorid | Rubin, BJ=7201761344 | en_HK |