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Article: On the behaviour of deep-ocean sediments

TitleOn the behaviour of deep-ocean sediments
Authors
KeywordsNumerical modelling and analysis
Offshore engineering
Sampling
Soil/structure interaction
Issue Date2004
PublisherThomas Telford Ltd. The Journal's web site is located at http://www.geotechnique-ice.com
Citation
Geotechnique, 2004, v. 54 n. 9, p. 571-580 How to Cite?
AbstractThe behaviour of deep-ocean sediments from the North Atlantic abyssal plains is examined within the context of a recognised framework, the Sensitivity Framework, which was developed by Cotecchia & Chandler for structured terrestrial clays. The deep-ocean sediments have very high sensitivities, of the order of those of quick clays, but in volumetric compression their destructuration occurs at more moderate rates, similar to those usually found in terrestrial clays of medium sensitivities. The deep-sea sediments were retrieved using different types of sampler, which influenced greatly the strength and stiffness of the different samples. In particular, in the lower-quality samples the greater disturbance caused by sampling is responsible for changing their behaviour from brittle to ductile during shearing after compression to stresses post-gross yield, giving them an apparent insensitivity to shear strains. Results from numerical analyses using a constitutive model that was developed for structured terrestrial clays are presented. They show that such a model, which accounts for natural structure, can be used to simulate the behaviour of deep-ocean sediments provided an appropriate destructuration law is used in the model.
Persistent Identifierhttp://hdl.handle.net/10722/91235
ISSN
2015 Impact Factor: 2.0
2015 SCImago Journal Rankings: 2.837
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorBaudet, BAen_HK
dc.contributor.authorHo, EWLen_HK
dc.date.accessioned2010-09-17T10:15:19Z-
dc.date.available2010-09-17T10:15:19Z-
dc.date.issued2004en_HK
dc.identifier.citationGeotechnique, 2004, v. 54 n. 9, p. 571-580en_HK
dc.identifier.issn0016-8505en_HK
dc.identifier.urihttp://hdl.handle.net/10722/91235-
dc.description.abstractThe behaviour of deep-ocean sediments from the North Atlantic abyssal plains is examined within the context of a recognised framework, the Sensitivity Framework, which was developed by Cotecchia & Chandler for structured terrestrial clays. The deep-ocean sediments have very high sensitivities, of the order of those of quick clays, but in volumetric compression their destructuration occurs at more moderate rates, similar to those usually found in terrestrial clays of medium sensitivities. The deep-sea sediments were retrieved using different types of sampler, which influenced greatly the strength and stiffness of the different samples. In particular, in the lower-quality samples the greater disturbance caused by sampling is responsible for changing their behaviour from brittle to ductile during shearing after compression to stresses post-gross yield, giving them an apparent insensitivity to shear strains. Results from numerical analyses using a constitutive model that was developed for structured terrestrial clays are presented. They show that such a model, which accounts for natural structure, can be used to simulate the behaviour of deep-ocean sediments provided an appropriate destructuration law is used in the model.en_HK
dc.languageengen_HK
dc.publisherThomas Telford Ltd. The Journal's web site is located at http://www.geotechnique-ice.comen_HK
dc.relation.ispartofGeotechniqueen_HK
dc.subjectNumerical modelling and analysisen_HK
dc.subjectOffshore engineeringen_HK
dc.subjectSamplingen_HK
dc.subjectSoil/structure interactionen_HK
dc.titleOn the behaviour of deep-ocean sedimentsen_HK
dc.typeArticleen_HK
dc.identifier.emailBaudet, BA:baudet@hku.hken_HK
dc.identifier.authorityBaudet, BA=rp01303en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1680/geot.54.9.571.56938en_HK
dc.identifier.scopuseid_2-s2.0-11244335703en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-11244335703&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume54en_HK
dc.identifier.issue9en_HK
dc.identifier.spage571en_HK
dc.identifier.epage580en_HK
dc.identifier.isiWOS:000226374800002-
dc.publisher.placeUnited Kingdomen_HK
dc.identifier.scopusauthoridBaudet, BA=15841467600en_HK
dc.identifier.scopusauthoridHo, EWL=36947404600en_HK

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