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Article: Multifractal characterization of random resistor and random superconductor networks

TitleMultifractal characterization of random resistor and random superconductor networks
Authors
Issue Date1991
PublisherAmerican Physical Society. The Journal's web site is located at http://pra.aps.org
Citation
Physical Review A, 1991, v. 44 n. 2, p. 960-967 How to Cite?
AbstractWe propose a generalized hierarchical model to study the multifractal properties of the random resistor and random superconductor networks. Analytical expressions for the moments of the voltage and current distributions are derived, and the critical exponents are calculated. The theoretical results are found to be in better agreement with the simulation data than previous studies. © 1991 The American Physical Society.
Persistent Identifierhttp://hdl.handle.net/10722/91168
ISSN
2014 Impact Factor: 2.808
2015 SCImago Journal Rankings: 1.418
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorLin, Ben_HK
dc.contributor.authorZhang, Z-Zen_HK
dc.contributor.authorHu, Ben_HK
dc.date.accessioned2010-09-17T10:14:03Z-
dc.date.available2010-09-17T10:14:03Z-
dc.date.issued1991en_HK
dc.identifier.citationPhysical Review A, 1991, v. 44 n. 2, p. 960-967en_HK
dc.identifier.issn1050-2947en_HK
dc.identifier.urihttp://hdl.handle.net/10722/91168-
dc.description.abstractWe propose a generalized hierarchical model to study the multifractal properties of the random resistor and random superconductor networks. Analytical expressions for the moments of the voltage and current distributions are derived, and the critical exponents are calculated. The theoretical results are found to be in better agreement with the simulation data than previous studies. © 1991 The American Physical Society.en_HK
dc.languageengen_HK
dc.publisherAmerican Physical Society. The Journal's web site is located at http://pra.aps.orgen_HK
dc.relation.ispartofPhysical Review Aen_HK
dc.titleMultifractal characterization of random resistor and random superconductor networksen_HK
dc.typeArticleen_HK
dc.identifier.emailLin, B:blin@hku.hken_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1103/PhysRevA.44.960en_HK
dc.identifier.scopuseid_2-s2.0-0346729460en_HK
dc.identifier.volume44en_HK
dc.identifier.issue2en_HK
dc.identifier.spage960en_HK
dc.identifier.epage967en_HK
dc.identifier.isiWOS:A1991FY46300023-

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