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Article: Efficient and Economical Test Equipment Setup Using Procorrelation

TitleEfficient and Economical Test Equipment Setup Using Procorrelation
Authors
KeywordsAutomatic Testing
Computational Complexity
Computer Software
Correlation Methods
Costs
Data Storage Equipment
Decision Theory
Dies
Electric Current Measurement
Failure Analysis
Heuristic Methods
Integrated Circuit Testing
Probability
Wsi Circuits
Issue Date2004
PublisherIEEE. The Journal's web site is located at http://www.computer.org/dt
Citation
IEEE Design and Test of Computers, 2004, v. 21 n. 1, p. 34-43 How to Cite?
AbstractA correlation evaluation system called the Procorrelation System (PCS) is discussed. PCS system is used for obtaining high-quality correlation between die failures on premanufactured recorded correlation wafer (RCW) and the wafer test equipment setup. PCS is a simple, fast, efficient, and economical software system used for the automatic verification of the ATE setup before the starting of the mass production process. It also facilitates the failure diagnosis and recovery in equipment setup. PCS greatly reduces analysis time and test costs, when compared with the conventional full-wafer probing techniques.
Persistent Identifierhttp://hdl.handle.net/10722/91130
ISSN
2012 Impact Factor: 1.623
References

 

DC FieldValueLanguage
dc.contributor.authorLin, B-Hen_HK
dc.contributor.authorWu, C-Wen_HK
dc.contributor.authorLuh, H-TAen_HK
dc.date.accessioned2010-09-17T10:13:29Z-
dc.date.available2010-09-17T10:13:29Z-
dc.date.issued2004en_HK
dc.identifier.citationIEEE Design and Test of Computers, 2004, v. 21 n. 1, p. 34-43en_HK
dc.identifier.issn0740-7475en_HK
dc.identifier.urihttp://hdl.handle.net/10722/91130-
dc.description.abstractA correlation evaluation system called the Procorrelation System (PCS) is discussed. PCS system is used for obtaining high-quality correlation between die failures on premanufactured recorded correlation wafer (RCW) and the wafer test equipment setup. PCS is a simple, fast, efficient, and economical software system used for the automatic verification of the ATE setup before the starting of the mass production process. It also facilitates the failure diagnosis and recovery in equipment setup. PCS greatly reduces analysis time and test costs, when compared with the conventional full-wafer probing techniques.en_HK
dc.languageengen_HK
dc.publisherIEEE. The Journal's web site is located at http://www.computer.org/dten_HK
dc.relation.ispartofIEEE Design and Test of Computersen_HK
dc.subjectAutomatic Testingen_HK
dc.subjectComputational Complexityen_HK
dc.subjectComputer Softwareen_HK
dc.subjectCorrelation Methodsen_HK
dc.subjectCostsen_HK
dc.subjectData Storage Equipmenten_HK
dc.subjectDecision Theoryen_HK
dc.subjectDiesen_HK
dc.subjectElectric Current Measurementen_HK
dc.subjectFailure Analysisen_HK
dc.subjectHeuristic Methodsen_HK
dc.subjectIntegrated Circuit Testingen_HK
dc.subjectProbabilityen_HK
dc.subjectWsi Circuitsen_HK
dc.titleEfficient and Economical Test Equipment Setup Using Procorrelationen_HK
dc.typeArticleen_HK
dc.identifier.emailLin, B:blin@hku.hken_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1109/MDT.2004.1261848en_HK
dc.identifier.scopuseid_2-s2.0-1342323839en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-1342323839&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume21en_HK
dc.identifier.issue1en_HK
dc.identifier.spage34en_HK
dc.identifier.epage43en_HK

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