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Conference Paper: Digitalization measurement of structure parameters of optic low-pass filter

TitleDigitalization measurement of structure parameters of optic low-pass filter
Authors
Li, YLin, BWu, ZZhu, LCao, X
KeywordsCmos Image Sensor
Measurement
Optical Low-Pass Filter
Structure Parameters
Issue Date2006
PublisherSPIE - International Society for Optical Engineering. The Journal's web site is located at https://www.spiedigitallibrary.org/conference-proceedings-of-spie
Citation
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies, Xian, China, 2-5 November 2005. In Proceedings of SPIE - The International Society for Optical Engineering, 2006, v. 6150 How to Cite?
DOI: http://dx.doi.org/10.1117/12.676417
AbstractA digitalization measurement method of structure parameters of optical low-pass filter (OLPF) is presented in this paper. OLPF which comprises two or three crystal plates is adopted in front of the CCD to reduce aliasing in a digitized image. Transiting a triple plate OLPF, an object of the point-source light can separate into eight points which are imaged in CMOS array. The distance of point to point provides us with the information of thickness of each crystal plate. The accuracy of measurement is better than 0.15 μm.
Persistent Identifierhttp://hdl.handle.net/10722/91083
ISSN
0277-786X
2020 SCImago Journal Rankings: 0.192
References
References in Scopus

 

DC FieldValueLanguage
dc.contributor.authorLi, Yen_HK
dc.contributor.authorLin, Ben_HK
dc.contributor.authorWu, Zen_HK
dc.contributor.authorZhu, Len_HK
dc.contributor.authorCao, Xen_HK
dc.date.accessioned2010-09-17T10:12:47Z-
dc.date.available2010-09-17T10:12:47Z-
dc.date.issued2006en_HK
dc.identifier.citation2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies, Xian, China, 2-5 November 2005. In Proceedings of SPIE - The International Society for Optical Engineering, 2006, v. 6150en_HK
dc.identifier.issn0277-786Xen_HK
dc.identifier.urihttp://hdl.handle.net/10722/91083-
dc.description.abstractA digitalization measurement method of structure parameters of optical low-pass filter (OLPF) is presented in this paper. OLPF which comprises two or three crystal plates is adopted in front of the CCD to reduce aliasing in a digitized image. Transiting a triple plate OLPF, an object of the point-source light can separate into eight points which are imaged in CMOS array. The distance of point to point provides us with the information of thickness of each crystal plate. The accuracy of measurement is better than 0.15 μm.en_HK
dc.languageengen_HK
dc.publisherSPIE - International Society for Optical Engineering. The Journal's web site is located at https://www.spiedigitallibrary.org/conference-proceedings-of-spie-
dc.relation.ispartofProceedings of SPIE - The International Society for Optical Engineeringen_HK
dc.subjectCmos Image Sensoren_HK
dc.subjectMeasurementen_HK
dc.subjectOptical Low-Pass Filteren_HK
dc.subjectStructure Parametersen_HK
dc.titleDigitalization measurement of structure parameters of optic low-pass filteren_HK
dc.typeConference_Paperen_HK
dc.identifier.emailLin, B:blin@hku.hken_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1117/12.676417en_HK
dc.identifier.scopuseid_2-s2.0-33645301317en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-33645301317&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume6150en_HK
dc.identifier.issnl0277-786X-

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