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Article: Low temperature sintering ability and electrical conductivity of SOFC interconnect material La0.7Ca0.3Cr0.97O3

TitleLow temperature sintering ability and electrical conductivity of SOFC interconnect material La0.7Ca0.3Cr0.97O3
Authors
KeywordsAuto-Ignition Process
Cr Deficiency
Interconnect
Lanthanum Chromite
Sofc
Issue Date2009
PublisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/jallcom
Citation
Journal of Alloys and Compounds, 2009, v. 468 n. 1-2, p. 499-504 How to Cite?
AbstractRelatively low temperature (1150-1300 °C) sintering characteristics and electric conductivities of La0.7Ca0.3Cr0.97O3 with a slight Cr deficiency of 0.03, prepared by an auto-ignition process, have been discussed. The material could reach 94.3% relative density at 1200 °C for 5 h in air, which is about 200 °C lower than that of with no Cr deficiency. XRD results indicated that pure perovskite phase was formed after sintered at the temperature range of 1150-1300 °C. The sample sintered at 1250 °C had the maximum conductivity of 62.0 S cm-1 at 850 °C in air, which is about 2.6 times as high as that of La0.7Ca0.3CrO3 with no Cr deficiency. In pure H2, it got the maximum electrical conductivity of 3.3 S cm-1 at 850 °C as sintered at 1200 °C. The TEC of the material was about 11.4 × 10-6 K-1, which is very compatible to that of other common used SOFC components. Therefore, it is a simple and cost-effective interconnect material for SOFCs. © 2008 Elsevier B.V. All rights reserved.
Persistent Identifierhttp://hdl.handle.net/10722/90941
ISSN
2015 Impact Factor: 3.014
2015 SCImago Journal Rankings: 1.006
ISI Accession Number ID
Funding AgencyGrant Number
Chinese Natural Science Foundation50572099
50730002
Chinese Research Foundation for the Doctors20060358034
Funding Information:

The authors would like to thank the financial support from Chinese Natural Science Foundation on contract No. 50572099, 50730002 and Chinese Research Foundation for the Doctors No. 20060358034.

References

 

DC FieldValueLanguage
dc.contributor.authorWang, Sen_HK
dc.contributor.authorLin, Ben_HK
dc.contributor.authorXie, Ken_HK
dc.contributor.authorDong, Yen_HK
dc.contributor.authorLiu, Xen_HK
dc.contributor.authorMeng, Gen_HK
dc.date.accessioned2010-09-17T10:10:40Z-
dc.date.available2010-09-17T10:10:40Z-
dc.date.issued2009en_HK
dc.identifier.citationJournal of Alloys and Compounds, 2009, v. 468 n. 1-2, p. 499-504en_HK
dc.identifier.issn0925-8388en_HK
dc.identifier.urihttp://hdl.handle.net/10722/90941-
dc.description.abstractRelatively low temperature (1150-1300 °C) sintering characteristics and electric conductivities of La0.7Ca0.3Cr0.97O3 with a slight Cr deficiency of 0.03, prepared by an auto-ignition process, have been discussed. The material could reach 94.3% relative density at 1200 °C for 5 h in air, which is about 200 °C lower than that of with no Cr deficiency. XRD results indicated that pure perovskite phase was formed after sintered at the temperature range of 1150-1300 °C. The sample sintered at 1250 °C had the maximum conductivity of 62.0 S cm-1 at 850 °C in air, which is about 2.6 times as high as that of La0.7Ca0.3CrO3 with no Cr deficiency. In pure H2, it got the maximum electrical conductivity of 3.3 S cm-1 at 850 °C as sintered at 1200 °C. The TEC of the material was about 11.4 × 10-6 K-1, which is very compatible to that of other common used SOFC components. Therefore, it is a simple and cost-effective interconnect material for SOFCs. © 2008 Elsevier B.V. All rights reserved.en_HK
dc.languageengen_HK
dc.publisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/jallcomen_HK
dc.relation.ispartofJournal of Alloys and Compoundsen_HK
dc.subjectAuto-Ignition Processen_HK
dc.subjectCr Deficiencyen_HK
dc.subjectInterconnecten_HK
dc.subjectLanthanum Chromiteen_HK
dc.subjectSofcen_HK
dc.titleLow temperature sintering ability and electrical conductivity of SOFC interconnect material La0.7Ca0.3Cr0.97O3en_HK
dc.typeArticleen_HK
dc.identifier.emailLin, B:blin@hku.hken_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1016/j.jallcom.2008.01.028en_HK
dc.identifier.scopuseid_2-s2.0-58049215227en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-58049215227&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume468en_HK
dc.identifier.issue1-2en_HK
dc.identifier.spage499en_HK
dc.identifier.epage504en_HK
dc.identifier.isiWOS:000263080000094-

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