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Article: On the modeling of piezoelectric wafer active sensor impedance analysis for structural health monitoring

TitleOn the modeling of piezoelectric wafer active sensor impedance analysis for structural health monitoring
Authors
KeywordsImpedance
Piezoelectric Wafer Active Sensors
Structural Health Monitoring
Issue Date2006
PublisherS P I E - International Society for Optical Engineering. The Journal's web site is located at http://www.spie.org/app/Publications/index.cfm?fuseaction=proceedings
Citation
Proceedings of SPIE - The International Society for Optical Engineering, 2006, v. 6174 I How to Cite?
AbstractStructural health monitoring (SHM) is important for reducing maintenance costs while increasing safety and reliability. Piezoelectric wafer active sensors (PWAS) used in SHM applications are able to detect structural damage using Lamb waves. PWAS are small, lightweight, unobtrusive, and inexpensive. PWAS achieve direct transduction between electric and elastic wave energies. PWAS are essential elements in the Lamb-wave SHM with pitch-catch, pulse-echo, phased array system and electromechanical impedance methods. This paper starts with the state of the art on the impedance method for PWAS applications. Then, finite element impedance model for free and bonded PWAS with different sizes and shapes will be given. Experiments showed that the real part and imaginary part of PWAS had different usage. Applications of impedance-based structural health monitoring indicate impedance method as a good candidate for damage detection and sensor durability verification for SHM smart sensor.
Persistent Identifierhttp://hdl.handle.net/10722/90785
ISSN
References

 

DC FieldValueLanguage
dc.contributor.authorLin, Ben_HK
dc.contributor.authorGiurgiutiu, Ven_HK
dc.date.accessioned2010-09-17T10:08:21Z-
dc.date.available2010-09-17T10:08:21Z-
dc.date.issued2006en_HK
dc.identifier.citationProceedings of SPIE - The International Society for Optical Engineering, 2006, v. 6174 Ien_HK
dc.identifier.issn0277-786Xen_HK
dc.identifier.urihttp://hdl.handle.net/10722/90785-
dc.description.abstractStructural health monitoring (SHM) is important for reducing maintenance costs while increasing safety and reliability. Piezoelectric wafer active sensors (PWAS) used in SHM applications are able to detect structural damage using Lamb waves. PWAS are small, lightweight, unobtrusive, and inexpensive. PWAS achieve direct transduction between electric and elastic wave energies. PWAS are essential elements in the Lamb-wave SHM with pitch-catch, pulse-echo, phased array system and electromechanical impedance methods. This paper starts with the state of the art on the impedance method for PWAS applications. Then, finite element impedance model for free and bonded PWAS with different sizes and shapes will be given. Experiments showed that the real part and imaginary part of PWAS had different usage. Applications of impedance-based structural health monitoring indicate impedance method as a good candidate for damage detection and sensor durability verification for SHM smart sensor.en_HK
dc.languageengen_HK
dc.publisherS P I E - International Society for Optical Engineering. The Journal's web site is located at http://www.spie.org/app/Publications/index.cfm?fuseaction=proceedingsen_HK
dc.relation.ispartofProceedings of SPIE - The International Society for Optical Engineeringen_HK
dc.subjectImpedanceen_HK
dc.subjectPiezoelectric Wafer Active Sensorsen_HK
dc.subjectStructural Health Monitoringen_HK
dc.titleOn the modeling of piezoelectric wafer active sensor impedance analysis for structural health monitoringen_HK
dc.typeArticleen_HK
dc.identifier.emailLin, B:blin@hku.hken_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1117/12.658521en_HK
dc.identifier.scopuseid_2-s2.0-33745955619en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-33745955619&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume6174 Ien_HK

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