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Conference Paper: Cultural differences in facial emotion recognition

TitleCultural differences in facial emotion recognition
Authors
Issue Date2003
PublisherAcademic Press. The Journal's web site is located at http://www.elsevier.com/locate/b&c
Citation
The 12th Annual Rotman Research Institute Conference, Toronto, ON., Canada, 25–26 March, 2002. In Brain and Cognition, 2003, v. 51 n. 2, p. 169-170, abstract no. 4 How to Cite?
DescriptionPart 2: posters of abstracts
Persistent Identifierhttp://hdl.handle.net/10722/89356
ISSN
2015 Impact Factor: 2.399
2015 SCImago Journal Rankings: 1.511

 

DC FieldValueLanguage
dc.contributor.authorYip, JTHen_HK
dc.contributor.authorLee, TMCen_HK
dc.date.accessioned2010-09-06T09:55:57Z-
dc.date.available2010-09-06T09:55:57Z-
dc.date.issued2003en_HK
dc.identifier.citationThe 12th Annual Rotman Research Institute Conference, Toronto, ON., Canada, 25–26 March, 2002. In Brain and Cognition, 2003, v. 51 n. 2, p. 169-170, abstract no. 4en_HK
dc.identifier.issn0278-2626en_HK
dc.identifier.urihttp://hdl.handle.net/10722/89356-
dc.descriptionPart 2: posters of abstracts-
dc.languageengen_HK
dc.publisherAcademic Press. The Journal's web site is located at http://www.elsevier.com/locate/b&cen_HK
dc.relation.ispartofBrain and Cognitionen_HK
dc.titleCultural differences in facial emotion recognitionen_HK
dc.typeConference_Paperen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0278-2626&volume=51&spage=169&epage=170&date=2003&atitle=Cultural+differences+in+facial+emotion+recognitionen_HK
dc.identifier.emailLee, TMC: tmclee@hku.hken_HK
dc.identifier.authorityLee, TMC=rp00564en_HK
dc.identifier.doi10.1016/S0278-2626(02)00541-9-
dc.identifier.hkuros91888en_HK
dc.identifier.hkuros95796-
dc.identifier.volume51-
dc.identifier.issue2-
dc.identifier.spage169, abstract no. 4-
dc.identifier.epage170-
dc.publisher.placeUnited States-
dc.description.otherThe 12th Annual Rotman Research Institute Conference, Toronto, Ontario, Canada, 25–26 March, 2002. In Brain and Cognition, 2003, v. 51 n. 2, p. 169-170, abstract no. 4-

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