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Article: Some difficulttopass tests of randomness
Title  Some difficulttopass tests of randomness 

Authors  
Issue Date  2002 
Publisher  University of California at Los Angeles, Department of Statistics. The Journal's web site is located at http://www.jstatsoft.org/ 
Citation  Journal Of Statistical Software, 2002, v. 7, p. 19 How to Cite? 
Abstract  We describe three tests of randomness  tests that many random number generators fail. In particular, all congruential generators  even those based on a prime modulusfail at least one of the tests, as do many simple generators, such as shift register and lagged Fibonacci. On the other hand, generators that pass the three tests seem to pass all the tests in the Diehard Battery of Tests. Note that these tests concern the randomness of a generator's output as a sequence of independent, uniform 32bit integers. For uses where the output is converted to uniform variates in [0,1), potential flaws of the output as integers will seldom cause problems after the conversion. Most generators seem to be adequate for producing a set of uniform reals in [0,1), but several important applications, notably in cryptography and number theory  for example, establishing probable primes, complexity of factoring algorithms, random partitions of large integers  may require satisfactory performance on the kinds of tests we describe here. 
Persistent Identifier  http://hdl.handle.net/10722/89163 
ISSN  2015 Impact Factor: 2.379 2015 SCImago Journal Rankings: 2.970 
References 
DC Field  Value  Language 

dc.contributor.author  Marsaglia, G  en_HK 
dc.contributor.author  Tsang, WW  en_HK 
dc.date.accessioned  20100906T09:53:10Z   
dc.date.available  20100906T09:53:10Z   
dc.date.issued  2002  en_HK 
dc.identifier.citation  Journal Of Statistical Software, 2002, v. 7, p. 19  en_HK 
dc.identifier.issn  15487660  en_HK 
dc.identifier.uri  http://hdl.handle.net/10722/89163   
dc.description.abstract  We describe three tests of randomness  tests that many random number generators fail. In particular, all congruential generators  even those based on a prime modulusfail at least one of the tests, as do many simple generators, such as shift register and lagged Fibonacci. On the other hand, generators that pass the three tests seem to pass all the tests in the Diehard Battery of Tests. Note that these tests concern the randomness of a generator's output as a sequence of independent, uniform 32bit integers. For uses where the output is converted to uniform variates in [0,1), potential flaws of the output as integers will seldom cause problems after the conversion. Most generators seem to be adequate for producing a set of uniform reals in [0,1), but several important applications, notably in cryptography and number theory  for example, establishing probable primes, complexity of factoring algorithms, random partitions of large integers  may require satisfactory performance on the kinds of tests we describe here.  en_HK 
dc.language  eng  en_HK 
dc.publisher  University of California at Los Angeles, Department of Statistics. The Journal's web site is located at http://www.jstatsoft.org/  en_HK 
dc.relation.ispartof  Journal of Statistical Software  en_HK 
dc.title  Some difficulttopass tests of randomness  en_HK 
dc.type  Article  en_HK 
dc.identifier.email  Tsang, WW:tsang@cs.hku.hk  en_HK 
dc.identifier.authority  Tsang, WW=rp00179  en_HK 
dc.description.nature  link_to_subscribed_fulltext   
dc.identifier.scopus  eid_2s2.00347666758  en_HK 
dc.identifier.hkuros  67138  en_HK 
dc.relation.references  http://www.scopus.com/mlt/select.url?eid=2s2.00347666758&selection=ref&src=s&origin=recordpage  en_HK 
dc.identifier.volume  7  en_HK 
dc.identifier.spage  1  en_HK 
dc.identifier.epage  9  en_HK 
dc.identifier.scopusauthorid  Marsaglia, G=6603739473  en_HK 
dc.identifier.scopusauthorid  Tsang, WW=7201558521  en_HK 