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Article: Critical values for testing for a single outlier in a nonlinear regression model

TitleCritical values for testing for a single outlier in a nonlinear regression model
Authors
Fung, WKNgai, MC
KeywordsBonferroni inequality
Critical values
Linear regression
Nonlinear regression
Outliers
Studentized residuals
Issue Date1998
PublisherTaylor & Francis Inc. The Journal's web site is located at http://www.tandf.co.uk/journals/titles/03610918.asp
Citation
Communications In Statistics Part B: Simulation And Computation, 1998, v. 27 n. 1, p. 95-105 How to Cite?
AbstractThe maximum absolute studentized residual is commonly used for testing for a single outlier in a linear regression model. This test statistic, however, is seldom discussed in a nonlinear regression setting. We simulate the critical values for the tests under various nonlinear models. The associated critical values are found to be very close to one another. Moreover, they are very well approximated using the critical values obtained from F-distributions based on the Bonferroni equations in linear models. The results are promising even in samples of size 6.
Persistent Identifierhttp://hdl.handle.net/10722/82859
ISSN
0361-0918
2021 Impact Factor: 1.162
2020 SCImago Journal Rankings: 0.426
References
References in Scopus

 

DC FieldValueLanguage
dc.contributor.authorFung, WKen_HK
dc.contributor.authorNgai, MCen_HK
dc.date.accessioned2010-09-06T08:34:14Z-
dc.date.available2010-09-06T08:34:14Z-
dc.date.issued1998en_HK
dc.identifier.citationCommunications In Statistics Part B: Simulation And Computation, 1998, v. 27 n. 1, p. 95-105en_HK
dc.identifier.issn0361-0918en_HK
dc.identifier.urihttp://hdl.handle.net/10722/82859-
dc.description.abstractThe maximum absolute studentized residual is commonly used for testing for a single outlier in a linear regression model. This test statistic, however, is seldom discussed in a nonlinear regression setting. We simulate the critical values for the tests under various nonlinear models. The associated critical values are found to be very close to one another. Moreover, they are very well approximated using the critical values obtained from F-distributions based on the Bonferroni equations in linear models. The results are promising even in samples of size 6.en_HK
dc.languageengen_HK
dc.publisherTaylor & Francis Inc. The Journal's web site is located at http://www.tandf.co.uk/journals/titles/03610918.aspen_HK
dc.relation.ispartofCommunications in Statistics Part B: Simulation and Computationen_HK
dc.subjectBonferroni inequalityen_HK
dc.subjectCritical valuesen_HK
dc.subjectLinear regressionen_HK
dc.subjectNonlinear regressionen_HK
dc.subjectOutliersen_HK
dc.subjectStudentized residualsen_HK
dc.titleCritical values for testing for a single outlier in a nonlinear regression modelen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0361-0918&volume=27&spage=95&epage=105&date=1998&atitle=Critical+values+for+testing+for+a+single+outlier+in+a+nonlinear+regression+modelen_HK
dc.identifier.emailFung, WK: wingfung@hku.hken_HK
dc.identifier.authorityFung, WK=rp00696en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.scopuseid_2-s2.0-0347775952en_HK
dc.identifier.hkuros34116en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0347775952&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume27en_HK
dc.identifier.issue1en_HK
dc.identifier.spage95en_HK
dc.identifier.epage105en_HK
dc.publisher.placeUnited Statesen_HK
dc.identifier.scopusauthoridFung, WK=13310399400en_HK
dc.identifier.scopusauthoridNgai, MC=36971499900en_HK
dc.identifier.issnl0361-0918-

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