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Article: Test-retest reliability of tone-burst-evoked otoacoustic emissions

TitleTest-retest reliability of tone-burst-evoked otoacoustic emissions
Authors
KeywordsAudiology
Otoacoustic emission
Reliability
Tone-burst otoacoustic emissions
Issue Date2000
PublisherInforma Healthcare. The Journal's web site is located at http://www.tandf.co.uk/journals/titles/00016489.asp
Citation
Acta Oto-Laryngologica, 2000, v. 120 n. 7, p. 825-834 How to Cite?
AbstractIn this study, the short- and long-term test-retest reliabilities of tone-burst-evoked otoacoustic emissions (TBOAEs) with 12 different tone-burst stimuli (4 frequencies [1, 1.5, 2 and 3 kHz] at 3 stimulus levels [≈76, ≈67 and ≈55 dB peSPL]) were examined in 30 normal hearing subjects. Click-evoked and spontaneous OAEs were recorded in parallel with TBOAEs to facilitate cross-comparisons and the generalization of results. Findings for click-evoked and spontaneous OAEs were comparable with most literature data. High reliability for TBOAEs was established for high and mid stimulus levels at all frequencies tested with reference to test-retest prevalence rate, test-retest occurrence, intra-subject test-retest difference and correlation coefficient. Derived half-octave band analysis at the frequency corresponding to the stimulus was found to reflect real TBOAE performance more reliably than broadband analysis. No significant difference between short- and long-term reliabilities was noted from all results. Similar test-retest reliabilities for high-level TBOAEs and click-evoked OAEs was obtained, suggesting that TBOAEs could potentially contribute to clinical assessment.
Persistent Identifierhttp://hdl.handle.net/10722/82602
ISSN
2015 Impact Factor: 1.127
2015 SCImago Journal Rankings: 0.666
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorChan, RHen_HK
dc.contributor.authorMcPherson, Ben_HK
dc.date.accessioned2010-09-06T08:31:13Z-
dc.date.available2010-09-06T08:31:13Z-
dc.date.issued2000en_HK
dc.identifier.citationActa Oto-Laryngologica, 2000, v. 120 n. 7, p. 825-834en_HK
dc.identifier.issn0001-6489en_HK
dc.identifier.urihttp://hdl.handle.net/10722/82602-
dc.description.abstractIn this study, the short- and long-term test-retest reliabilities of tone-burst-evoked otoacoustic emissions (TBOAEs) with 12 different tone-burst stimuli (4 frequencies [1, 1.5, 2 and 3 kHz] at 3 stimulus levels [≈76, ≈67 and ≈55 dB peSPL]) were examined in 30 normal hearing subjects. Click-evoked and spontaneous OAEs were recorded in parallel with TBOAEs to facilitate cross-comparisons and the generalization of results. Findings for click-evoked and spontaneous OAEs were comparable with most literature data. High reliability for TBOAEs was established for high and mid stimulus levels at all frequencies tested with reference to test-retest prevalence rate, test-retest occurrence, intra-subject test-retest difference and correlation coefficient. Derived half-octave band analysis at the frequency corresponding to the stimulus was found to reflect real TBOAE performance more reliably than broadband analysis. No significant difference between short- and long-term reliabilities was noted from all results. Similar test-retest reliabilities for high-level TBOAEs and click-evoked OAEs was obtained, suggesting that TBOAEs could potentially contribute to clinical assessment.en_HK
dc.languageengen_HK
dc.publisherInforma Healthcare. The Journal's web site is located at http://www.tandf.co.uk/journals/titles/00016489.aspen_HK
dc.relation.ispartofActa Oto-Laryngologicaen_HK
dc.rightsActa Oto-Laryngologica. Copyright © Informa Healthcare.en_HK
dc.subjectAudiologyen_HK
dc.subjectOtoacoustic emissionen_HK
dc.subjectReliabilityen_HK
dc.subjectTone-burst otoacoustic emissionsen_HK
dc.titleTest-retest reliability of tone-burst-evoked otoacoustic emissionsen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0001-6489&volume=120&spage=825&epage=834&date=2000&atitle=Test-retest+reliability+of+tone-burst+evoked+otoacoustic+emissionsen_HK
dc.identifier.emailMcPherson, B: dbmcpher@hkucc.hku.hken_HK
dc.identifier.authorityMcPherson, B=rp00937en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1080/000164800750061679en_HK
dc.identifier.pmid11132715-
dc.identifier.scopuseid_2-s2.0-0034439837en_HK
dc.identifier.hkuros58632en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0034439837&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume120en_HK
dc.identifier.issue7en_HK
dc.identifier.spage825en_HK
dc.identifier.epage834en_HK
dc.identifier.isiWOS:000165852100007-
dc.publisher.placeUnited Kingdomen_HK
dc.identifier.scopusauthoridChan, RH=36907992200en_HK
dc.identifier.scopusauthoridMcPherson, B=7006800770en_HK

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