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Article: Microstructural Study of the Tilted Epitaxial Thin Films of YBa2Cu3O7-d with a (105) Orientation

TitleMicrostructural Study of the Tilted Epitaxial Thin Films of YBa2Cu3O7-d with a (105) Orientation
Authors
KeywordsAnisotropic superconductors
Defect structures
Thin films
Issue Date1997
PublisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/physc
Citation
Physica C: Superconductivity and its Applications, 1997, v. 290, p. 23-30 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/81080
ISSN
2023 Impact Factor: 1.3
2023 SCImago Journal Rankings: 0.339
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorYang, Yen_HK
dc.contributor.authorGao, Jen_HK
dc.contributor.authorChui, TCen_HK
dc.contributor.authorLi, Len_HK
dc.date.accessioned2010-09-06T08:13:31Z-
dc.date.available2010-09-06T08:13:31Z-
dc.date.issued1997en_HK
dc.identifier.citationPhysica C: Superconductivity and its Applications, 1997, v. 290, p. 23-30en_HK
dc.identifier.issn0921-4534en_HK
dc.identifier.urihttp://hdl.handle.net/10722/81080-
dc.languageengen_HK
dc.publisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/physcen_HK
dc.relation.ispartofPhysica C: Superconductivity and its Applicationsen_HK
dc.rightsPhysica C: Superconductivity and its Applications. Copyright © Elsevier BV.en_HK
dc.subjectAnisotropic superconductors-
dc.subjectDefect structures-
dc.subjectThin films-
dc.titleMicrostructural Study of the Tilted Epitaxial Thin Films of YBa2Cu3O7-d with a (105) Orientationen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0921-4534&volume=290&spage=23&epage=30&date=1997&atitle=Microstructural+Study+of+the+Tilted+Epitaxial+Thin+Films+of+YBa2Cu3O7-d+with+a+(105)+Orientationen_HK
dc.identifier.emailGao, J: jugao@hku.hken_HK
dc.identifier.authorityGao, J=rp00699en_HK
dc.identifier.doi10.1016/S0921-4534(97)01630-4-
dc.identifier.scopuseid_2-s2.0-0031249914-
dc.identifier.hkuros29743en_HK
dc.identifier.isiWOS:000071174800003-
dc.identifier.issnl0921-4534-

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