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Article: Positron transport studies at the Au-(InP: Fe) interface

TitlePositron transport studies at the Au-(InP: Fe) interface
Authors
Issue Date1996
PublisherInstitute of Physics Publishing. The Journal's web site is located at http://www.iop.org/Journals/jpcm
Citation
Journal Of Physics Condensed Matter, 1996, v. 8 n. 10, p. 1403-1412 How to Cite?
AbstractPositron mobility and lifetime measurements have been carried out on semi-insulating Fe-doped InP samples with Au contacts used for electric field application. The lifetime measurements, with electric fields directed towards the Au-InP:Fe interface, reveal no component associated with interfacial open-volume sites and thus give no evidence of any positron mobility. The mobility measurements, made using the Doppler-shifted annihilation radiation technique, however, reveal a temperature independent positron mobility of about 20 cm 2 V -1 s -1 in the range 150-300 K. These observations, together with results from I-V analysis, are discussed with reference to two possible band-bending schemes. The first, which requires an ionized shallow donor region adjacent to the Au-InP interface, seems less plausible on a number of grounds. In the second, however, an Fe 2+ negative space charge produces an adverse diffusion barrier for positrons approaching the interface together with a non-uniform electric field in the samples capable of explaining the observed mobility results.
Persistent Identifierhttp://hdl.handle.net/10722/81009
ISSN
2015 Impact Factor: 2.209
2015 SCImago Journal Rankings: 0.812
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorAu, HLen_HK
dc.contributor.authorLee, TCen_HK
dc.contributor.authorBeling, CDen_HK
dc.contributor.authorFung, Sen_HK
dc.date.accessioned2010-09-06T08:12:44Z-
dc.date.available2010-09-06T08:12:44Z-
dc.date.issued1996en_HK
dc.identifier.citationJournal Of Physics Condensed Matter, 1996, v. 8 n. 10, p. 1403-1412en_HK
dc.identifier.issn0953-8984en_HK
dc.identifier.urihttp://hdl.handle.net/10722/81009-
dc.description.abstractPositron mobility and lifetime measurements have been carried out on semi-insulating Fe-doped InP samples with Au contacts used for electric field application. The lifetime measurements, with electric fields directed towards the Au-InP:Fe interface, reveal no component associated with interfacial open-volume sites and thus give no evidence of any positron mobility. The mobility measurements, made using the Doppler-shifted annihilation radiation technique, however, reveal a temperature independent positron mobility of about 20 cm 2 V -1 s -1 in the range 150-300 K. These observations, together with results from I-V analysis, are discussed with reference to two possible band-bending schemes. The first, which requires an ionized shallow donor region adjacent to the Au-InP interface, seems less plausible on a number of grounds. In the second, however, an Fe 2+ negative space charge produces an adverse diffusion barrier for positrons approaching the interface together with a non-uniform electric field in the samples capable of explaining the observed mobility results.en_HK
dc.languageengen_HK
dc.publisherInstitute of Physics Publishing. The Journal's web site is located at http://www.iop.org/Journals/jpcmen_HK
dc.relation.ispartofJournal of Physics Condensed Matteren_HK
dc.titlePositron transport studies at the Au-(InP: Fe) interfaceen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0953-8984&volume=8&spage=1403&epage=1412&date=1996&atitle=Positron+transport+studies+at+the+Au-(InP:Fe)+interfaceen_HK
dc.identifier.emailBeling, CD: cdbeling@hkucc.hku.hken_HK
dc.identifier.emailFung, S: sfung@hku.hken_HK
dc.identifier.authorityBeling, CD=rp00660en_HK
dc.identifier.authorityFung, S=rp00695en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1088/0953-8984/8/10/012en_HK
dc.identifier.scopuseid_2-s2.0-4243087405en_HK
dc.identifier.hkuros9546en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-4243087405&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume8en_HK
dc.identifier.issue10en_HK
dc.identifier.spage1403en_HK
dc.identifier.epage1412en_HK
dc.identifier.isiWOS:A1996TZ27400012-
dc.publisher.placeUnited Kingdomen_HK
dc.identifier.scopusauthoridAu, HL=7004152230en_HK
dc.identifier.scopusauthoridLee, TC=36347141200en_HK
dc.identifier.scopusauthoridBeling, CD=7005864180en_HK
dc.identifier.scopusauthoridFung, S=7201970040en_HK

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