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- Publisher Website: 10.1016/S0038-1098(02)00224-7
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Article: Two post-breakdown metastable phases in semi-insulating GaAs
Title | Two post-breakdown metastable phases in semi-insulating GaAs |
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Authors | |
Keywords | A. Metastability Breakdown SI-GaAs |
Issue Date | 2002 |
Publisher | Pergamon. The Journal's web site is located at http://www.elsevier.com/locate/ssc |
Citation | Solid State Communications, 2002, v. 123 n. 3-4, p. 123-127 How to Cite? |
Abstract | A room temperature electrically induced metastability in semi-insulating (SI)-GaAs has recently been reported in which the normally high resistivity state of SI-GaAs converts into a low resistance state when breakdown electric fields are applied to the metal/SI-GaAs/metal system. The present study finds that this post-breakdown metastable state can be classified into two metastable phases, namely a metastable high current phase and a metastable low current phase. This effect resembles the poorly understood 'lock-on' effect utilized in high power photoconductive semiconductor switches. It is argued that instead of a short pulse of light photo-ionizing the SI-GaAs and causing a carrier avalanche current that does not 'switch off' at low biases, the same avalanche current and effects are being brought about by the electrical breakdown of the sample. © 2002 Elsevier Science Ltd. All rights reserved. |
Persistent Identifier | http://hdl.handle.net/10722/80996 |
ISSN | 2023 Impact Factor: 2.1 2023 SCImago Journal Rankings: 0.414 |
ISI Accession Number ID | |
References |
DC Field | Value | Language |
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dc.contributor.author | Luo, YL | en_HK |
dc.contributor.author | Fung, S | en_HK |
dc.contributor.author | Beling, CD | en_HK |
dc.date.accessioned | 2010-09-06T08:12:35Z | - |
dc.date.available | 2010-09-06T08:12:35Z | - |
dc.date.issued | 2002 | en_HK |
dc.identifier.citation | Solid State Communications, 2002, v. 123 n. 3-4, p. 123-127 | en_HK |
dc.identifier.issn | 0038-1098 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/80996 | - |
dc.description.abstract | A room temperature electrically induced metastability in semi-insulating (SI)-GaAs has recently been reported in which the normally high resistivity state of SI-GaAs converts into a low resistance state when breakdown electric fields are applied to the metal/SI-GaAs/metal system. The present study finds that this post-breakdown metastable state can be classified into two metastable phases, namely a metastable high current phase and a metastable low current phase. This effect resembles the poorly understood 'lock-on' effect utilized in high power photoconductive semiconductor switches. It is argued that instead of a short pulse of light photo-ionizing the SI-GaAs and causing a carrier avalanche current that does not 'switch off' at low biases, the same avalanche current and effects are being brought about by the electrical breakdown of the sample. © 2002 Elsevier Science Ltd. All rights reserved. | en_HK |
dc.language | eng | en_HK |
dc.publisher | Pergamon. The Journal's web site is located at http://www.elsevier.com/locate/ssc | en_HK |
dc.relation.ispartof | Solid State Communications | en_HK |
dc.subject | A. Metastability | en_HK |
dc.subject | Breakdown | en_HK |
dc.subject | SI-GaAs | en_HK |
dc.title | Two post-breakdown metastable phases in semi-insulating GaAs | en_HK |
dc.type | Article | en_HK |
dc.identifier.openurl | http://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0038-1098&volume=123&spage=123&epage=127&date=2002&atitle=Two+post-breakdown+metastable+phases+in+semi-insulating+GaAs+ | en_HK |
dc.identifier.email | Fung, S: sfung@hku.hk | en_HK |
dc.identifier.email | Beling, CD: cdbeling@hkucc.hku.hk | en_HK |
dc.identifier.authority | Fung, S=rp00695 | en_HK |
dc.identifier.authority | Beling, CD=rp00660 | en_HK |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1016/S0038-1098(02)00224-7 | en_HK |
dc.identifier.scopus | eid_2-s2.0-0036646347 | en_HK |
dc.identifier.hkuros | 74833 | en_HK |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-0036646347&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 123 | en_HK |
dc.identifier.issue | 3-4 | en_HK |
dc.identifier.spage | 123 | en_HK |
dc.identifier.epage | 127 | en_HK |
dc.identifier.isi | WOS:000177577800008 | - |
dc.publisher.place | United Kingdom | en_HK |
dc.identifier.scopusauthorid | Luo, YL=55187936600 | en_HK |
dc.identifier.scopusauthorid | Fung, S=7201970040 | en_HK |
dc.identifier.scopusauthorid | Beling, CD=7005864180 | en_HK |
dc.identifier.issnl | 0038-1098 | - |