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Article: Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis
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TitleNon-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis
 
AuthorsBrauer, G3
Anwand, W3
Grambole, D3
Skorupa, W3
Hou, Y1
Andreev, A1
Teichert, C1
Tam, KH2
Djurišić, AB2
 
Issue Date2007
 
PublisherInstitute of Physics Publishing. The Journal's web site is located at http://www.iop.org/journals/nano
 
CitationNanotechnology, 2007, v. 18 n. 19 [How to Cite?]
DOI: http://dx.doi.org/10.1088/0957-4484/18/19/195301
 
AbstractZnO nanorods, grown by a hydrothermal method, have been characterized by slow positron implantation spectroscopy (SPIS) and atomic force microscopy (AFM). It has been demonstrated that such non-destructive characterization techniques can provide a comprehensive picture of the nanorod structure (including its length, shape, orientation, and seed layer thickness), as well as provide additional information about defects present in the structure. Nanorods were also characterized by scanning electron microscopy (SEM) and x-ray diffraction (XRD), and it was found that the SPIS/AFM combination is more sensitive to the nanorod orientation and the thickness of the seed layer. To obtain still more information about defects in the nanorods, as well as to confirm the findings on the sample structure, nuclear reaction analysis (NRA) was performed and a large concentration of bound hydrogen was found. The results obtained by different characterization techniques are discussed. © IOP Publishing Ltd.
 
ISSN0957-4484
2013 Impact Factor: 3.672
 
DOIhttp://dx.doi.org/10.1088/0957-4484/18/19/195301
 
ISI Accession Number IDWOS:000246589900011
 
ReferencesReferences in Scopus
 
DC FieldValue
dc.contributor.authorBrauer, G
 
dc.contributor.authorAnwand, W
 
dc.contributor.authorGrambole, D
 
dc.contributor.authorSkorupa, W
 
dc.contributor.authorHou, Y
 
dc.contributor.authorAndreev, A
 
dc.contributor.authorTeichert, C
 
dc.contributor.authorTam, KH
 
dc.contributor.authorDjurišić, AB
 
dc.date.accessioned2010-09-06T08:12:15Z
 
dc.date.available2010-09-06T08:12:15Z
 
dc.date.issued2007
 
dc.description.abstractZnO nanorods, grown by a hydrothermal method, have been characterized by slow positron implantation spectroscopy (SPIS) and atomic force microscopy (AFM). It has been demonstrated that such non-destructive characterization techniques can provide a comprehensive picture of the nanorod structure (including its length, shape, orientation, and seed layer thickness), as well as provide additional information about defects present in the structure. Nanorods were also characterized by scanning electron microscopy (SEM) and x-ray diffraction (XRD), and it was found that the SPIS/AFM combination is more sensitive to the nanorod orientation and the thickness of the seed layer. To obtain still more information about defects in the nanorods, as well as to confirm the findings on the sample structure, nuclear reaction analysis (NRA) was performed and a large concentration of bound hydrogen was found. The results obtained by different characterization techniques are discussed. © IOP Publishing Ltd.
 
dc.description.naturelink_to_subscribed_fulltext
 
dc.identifier.citationNanotechnology, 2007, v. 18 n. 19 [How to Cite?]
DOI: http://dx.doi.org/10.1088/0957-4484/18/19/195301
 
dc.identifier.doihttp://dx.doi.org/10.1088/0957-4484/18/19/195301
 
dc.identifier.hkuros126640
 
dc.identifier.isiWOS:000246589900011
 
dc.identifier.issn0957-4484
2013 Impact Factor: 3.672
 
dc.identifier.issue19
 
dc.identifier.openurl
 
dc.identifier.scopuseid_2-s2.0-34249079756
 
dc.identifier.urihttp://hdl.handle.net/10722/80965
 
dc.identifier.volume18
 
dc.languageeng
 
dc.publisherInstitute of Physics Publishing. The Journal's web site is located at http://www.iop.org/journals/nano
 
dc.publisher.placeUnited Kingdom
 
dc.relation.ispartofNanotechnology
 
dc.relation.referencesReferences in Scopus
 
dc.titleNon-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis
 
dc.typeArticle
 
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<contributor.author>Andreev, A</contributor.author>
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Author Affiliations
  1. Institut fu&amp;#x0308;r Physik
  2. The University of Hong Kong
  3. Forschungszentrum Dresden Rossendorf