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Article: Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis

TitleNon-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis
Authors
Issue Date2007
PublisherInstitute of Physics Publishing. The Journal's web site is located at http://www.iop.org/journals/nano
Citation
Nanotechnology, 2007, v. 18 n. 19 How to Cite?
Abstract
ZnO nanorods, grown by a hydrothermal method, have been characterized by slow positron implantation spectroscopy (SPIS) and atomic force microscopy (AFM). It has been demonstrated that such non-destructive characterization techniques can provide a comprehensive picture of the nanorod structure (including its length, shape, orientation, and seed layer thickness), as well as provide additional information about defects present in the structure. Nanorods were also characterized by scanning electron microscopy (SEM) and x-ray diffraction (XRD), and it was found that the SPIS/AFM combination is more sensitive to the nanorod orientation and the thickness of the seed layer. To obtain still more information about defects in the nanorods, as well as to confirm the findings on the sample structure, nuclear reaction analysis (NRA) was performed and a large concentration of bound hydrogen was found. The results obtained by different characterization techniques are discussed. © IOP Publishing Ltd.
Persistent Identifierhttp://hdl.handle.net/10722/80965
ISSN
2013 Impact Factor: 3.672
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorBrauer, Gen_HK
dc.contributor.authorAnwand, Wen_HK
dc.contributor.authorGrambole, Den_HK
dc.contributor.authorSkorupa, Wen_HK
dc.contributor.authorHou, Yen_HK
dc.contributor.authorAndreev, Aen_HK
dc.contributor.authorTeichert, Cen_HK
dc.contributor.authorTam, KHen_HK
dc.contributor.authorDjurišić, ABen_HK
dc.date.accessioned2010-09-06T08:12:15Z-
dc.date.available2010-09-06T08:12:15Z-
dc.date.issued2007en_HK
dc.identifier.citationNanotechnology, 2007, v. 18 n. 19en_HK
dc.identifier.issn0957-4484en_HK
dc.identifier.urihttp://hdl.handle.net/10722/80965-
dc.description.abstractZnO nanorods, grown by a hydrothermal method, have been characterized by slow positron implantation spectroscopy (SPIS) and atomic force microscopy (AFM). It has been demonstrated that such non-destructive characterization techniques can provide a comprehensive picture of the nanorod structure (including its length, shape, orientation, and seed layer thickness), as well as provide additional information about defects present in the structure. Nanorods were also characterized by scanning electron microscopy (SEM) and x-ray diffraction (XRD), and it was found that the SPIS/AFM combination is more sensitive to the nanorod orientation and the thickness of the seed layer. To obtain still more information about defects in the nanorods, as well as to confirm the findings on the sample structure, nuclear reaction analysis (NRA) was performed and a large concentration of bound hydrogen was found. The results obtained by different characterization techniques are discussed. © IOP Publishing Ltd.en_HK
dc.languageengen_HK
dc.publisherInstitute of Physics Publishing. The Journal's web site is located at http://www.iop.org/journals/nanoen_HK
dc.relation.ispartofNanotechnologyen_HK
dc.titleNon-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysisen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0957-4484&volume=18&spage=195301: 1&epage=8&date=2007&atitle=Non-destructive+characterization+of+vertical+ZnO+nanowire+arrays+by+slow+positron+implantation+spectroscopy,+atomic+force+microscopy,+and+nuclear+reaction+analysisen_HK
dc.identifier.emailDjurišić, AB: dalek@hku.hken_HK
dc.identifier.authorityDjurišić, AB=rp00690en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1088/0957-4484/18/19/195301en_HK
dc.identifier.scopuseid_2-s2.0-34249079756en_HK
dc.identifier.hkuros126640en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-34249079756&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume18en_HK
dc.identifier.issue19en_HK
dc.identifier.isiWOS:000246589900011-
dc.publisher.placeUnited Kingdomen_HK
dc.identifier.scopusauthoridBrauer, G=7101650540en_HK
dc.identifier.scopusauthoridAnwand, W=9432786300en_HK
dc.identifier.scopusauthoridGrambole, D=7004711621en_HK
dc.identifier.scopusauthoridSkorupa, W=7102608722en_HK
dc.identifier.scopusauthoridHou, Y=16316471600en_HK
dc.identifier.scopusauthoridAndreev, A=7401471007en_HK
dc.identifier.scopusauthoridTeichert, C=7003900900en_HK
dc.identifier.scopusauthoridTam, KH=8533246200en_HK
dc.identifier.scopusauthoridDjurišić, AB=7004904830en_HK

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