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Article: A model for GaN 'ghost' islands
Title | A model for GaN 'ghost' islands |
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Authors | |
Keywords | Gallium nitride Molecular beam epitaxy Nucleation |
Issue Date | 2004 |
Publisher | Elsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/susc |
Citation | Surface Science, 2004, v. 558 n. 1-3, p. 195-200 How to Cite? |
Abstract | During submonolayer deposition of GaN by molecular-beam epitaxy (MBE), novel 'ghost' islands are observed by scanning tunneling microscopy (STM). The island contrast depends on gap voltage of the STM, suggesting a different atomic structure of the islands than that of GaN terrace or normal islands. Formation of 'ghost' islands is related to the presence of excess gallium atoms on surface during MBE. Island size distribution show no peak but a monotonically decaying curve, indicating a surfactant mediated process for nucleation of such islands. A model is put forward explaining the origin and the structure of such islands. © 2004 Elsevier B.V. All rights reserved. |
Persistent Identifier | http://hdl.handle.net/10722/80927 |
ISSN | 2023 Impact Factor: 2.1 2023 SCImago Journal Rankings: 0.385 |
ISI Accession Number ID | |
References |
DC Field | Value | Language |
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dc.contributor.author | Xie, MH | en_HK |
dc.contributor.author | Zheng, LX | en_HK |
dc.contributor.author | Dai, XQ | en_HK |
dc.contributor.author | Wu, HS | en_HK |
dc.contributor.author | Tong, SY | en_HK |
dc.date.accessioned | 2010-09-06T08:11:49Z | - |
dc.date.available | 2010-09-06T08:11:49Z | - |
dc.date.issued | 2004 | en_HK |
dc.identifier.citation | Surface Science, 2004, v. 558 n. 1-3, p. 195-200 | en_HK |
dc.identifier.issn | 0039-6028 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/80927 | - |
dc.description.abstract | During submonolayer deposition of GaN by molecular-beam epitaxy (MBE), novel 'ghost' islands are observed by scanning tunneling microscopy (STM). The island contrast depends on gap voltage of the STM, suggesting a different atomic structure of the islands than that of GaN terrace or normal islands. Formation of 'ghost' islands is related to the presence of excess gallium atoms on surface during MBE. Island size distribution show no peak but a monotonically decaying curve, indicating a surfactant mediated process for nucleation of such islands. A model is put forward explaining the origin and the structure of such islands. © 2004 Elsevier B.V. All rights reserved. | en_HK |
dc.language | eng | en_HK |
dc.publisher | Elsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/susc | en_HK |
dc.relation.ispartof | Surface Science | en_HK |
dc.rights | Surface Science. Copyright © Elsevier BV. | en_HK |
dc.subject | Gallium nitride | en_HK |
dc.subject | Molecular beam epitaxy | en_HK |
dc.subject | Nucleation | en_HK |
dc.title | A model for GaN 'ghost' islands | en_HK |
dc.type | Article | en_HK |
dc.identifier.openurl | http://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0039-6028&volume=558&spage=195&epage=200&date=2004&atitle=A+model+for+GaN+‘ghost’+islands | en_HK |
dc.identifier.email | Xie, MH: mhxie@hku.hk | en_HK |
dc.identifier.email | Wu, HS: hswu@hkucc.hku.hk | en_HK |
dc.identifier.authority | Xie, MH=rp00818 | en_HK |
dc.identifier.authority | Wu, HS=rp00813 | en_HK |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1016/j.susc.2004.04.003 | en_HK |
dc.identifier.scopus | eid_2-s2.0-2342501772 | en_HK |
dc.identifier.hkuros | 88905 | en_HK |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-2342501772&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 558 | en_HK |
dc.identifier.issue | 1-3 | en_HK |
dc.identifier.spage | 195 | en_HK |
dc.identifier.epage | 200 | en_HK |
dc.identifier.isi | WOS:000221728000019 | - |
dc.publisher.place | Netherlands | en_HK |
dc.identifier.scopusauthorid | Xie, MH=7202255416 | en_HK |
dc.identifier.scopusauthorid | Zheng, LX=7403405881 | en_HK |
dc.identifier.scopusauthorid | Dai, XQ=55237280400 | en_HK |
dc.identifier.scopusauthorid | Wu, HS=7405584367 | en_HK |
dc.identifier.scopusauthorid | Tong, SY=24512624800 | en_HK |
dc.identifier.issnl | 0039-6028 | - |