File Download

There are no files associated with this item.

  Links for fulltext
     (May Require Subscription)
Supplementary

Article: Microstructural characterization of YBa2Cu3O7-x thin films grown on Y-ZrO2

TitleMicrostructural characterization of YBa2Cu3O7-x thin films grown on Y-ZrO2
Authors
Issue Date2003
PublisherElsevier SA. The Journal's web site is located at http://www.elsevier.com/locate/tsf
Citation
Thin Solid Films, 2003, v. 437, p. 272-275 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/80862
ISSN
2015 Impact Factor: 1.761
2015 SCImago Journal Rankings: 0.726

 

DC FieldValueLanguage
dc.contributor.authorLiu, CXen_HK
dc.contributor.authorChen, XMen_HK
dc.contributor.authorWang, Yen_HK
dc.contributor.authorXu, Men_HK
dc.contributor.authorLuo, GMen_HK
dc.contributor.authorMai, ZHen_HK
dc.contributor.authorTang, Wen_HK
dc.contributor.authorGao, Jen_HK
dc.contributor.authorJia, QJen_HK
dc.contributor.authorZheng, WLen_HK
dc.contributor.authorChen, ZJen_HK
dc.date.accessioned2010-09-06T08:11:05Z-
dc.date.available2010-09-06T08:11:05Z-
dc.date.issued2003en_HK
dc.identifier.citationThin Solid Films, 2003, v. 437, p. 272-275en_HK
dc.identifier.issn0040-6090en_HK
dc.identifier.urihttp://hdl.handle.net/10722/80862-
dc.languageengen_HK
dc.publisherElsevier SA. The Journal's web site is located at http://www.elsevier.com/locate/tsfen_HK
dc.relation.ispartofThin Solid Filmsen_HK
dc.titleMicrostructural characterization of YBa2Cu3O7-x thin films grown on Y-ZrO2en_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0040-6090&volume=437&spage=272&epage=275&date=2003&atitle=Microstructural+characterization+of+YBa2Cu3O7-x+thin+films+grown+on+Y-ZrO2en_HK
dc.identifier.emailTang, W: whtang@aphy.iphy.ac.cnen_HK
dc.identifier.emailGao, J: jugao@hku.hken_HK
dc.identifier.authorityGao, J=rp00699en_HK
dc.identifier.scopuseid_2-s2.0-0038785561-
dc.identifier.hkuros84990en_HK

Export via OAI-PMH Interface in XML Formats


OR


Export to Other Non-XML Formats