Article: Depth Profiling of Vacancy-Type Defects in Homogenous and Mutlilayered a-Si Films by Positron Beam Doppler Broadening

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TitleDepth Profiling of Vacancy-Type Defects in Homogenous and Mutlilayered a-Si Films by Positron Beam Doppler Broadening
AuthorsZou, X
Webb, DP
Chan, YC
Lam, YW
Hu, Y
Gong, M
Beling, CD
Fung, SHY
Issue Date1998
PublisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/jnoncrysol
CitationJournal of Non-Crystalline Solids, 1998, v. 227-230, p. 105-110 [How to Cite?]
ISSN0022-3093
2011 Impact Factor: 1.537
2011 SCImago Journal Rankings: 0.165
DC Field
Value
dc.contributor.authorZou, X
dc.contributor.authorWebb, DP
dc.contributor.authorChan, YC
dc.contributor.authorLam, YW
dc.contributor.authorHu, Y
dc.contributor.authorGong, M
dc.contributor.authorBeling, CD
dc.contributor.authorFung, SHY
dc.date.accessioned2010-09-06T08:10:57Z
dc.date.available2010-09-06T08:10:57Z
dc.date.issued1998
dc.identifier.citationJournal of Non-Crystalline Solids, 1998, v. 227-230, p. 105-110 [How to Cite?]
dc.identifier.hkuros34912
dc.identifier.issn0022-3093
2011 Impact Factor: 1.537
2011 SCImago Journal Rankings: 0.165
dc.identifier.openurl
dc.identifier.urihttp://hdl.handle.net/10722/80849
dc.languageeng
dc.publisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/jnoncrysol
dc.relation.ispartofJournal of Non-Crystalline Solids
dc.rightsJournal of Non-Crystalline Solids. Copyright © Elsevier BV.
dc.titleDepth Profiling of Vacancy-Type Defects in Homogenous and Mutlilayered a-Si Films by Positron Beam Doppler Broadening
dc.typeArticle