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Conference Paper: Defect identification using positrons

TitleDefect identification using positrons
Authors
Keywordsα-Si:H
6H-SiC
Deep level transient spectroscopy
Doppler broadening spectroscopy
Double Doppler broadening spectroscopy
Lifetime spectroscopy
Positron deep level transient spectroscopy
Issue Date2001
PublisherTrans Tech Publications Ltd. The Journal's web site is located at http://www.scientific.net
Citation
Materials Science Forum, 2001, v. 363-365, p. 25-29 How to Cite?
AbstractThe current use of the lifetime and Doppler broadening techniques in defect identification is demonstrated with two studies, the first being the identification of carbon vacancy in n-6H SiC through lifetime spectroscopy, and the second the production of de-hydrogenated voids in α-Si:H through light soaking. Some less conventional ideas are presented for more specific defect identification, namely (i) the amalgamation of lifetime and Doppler techniques with conventional deep level transient spectroscopy in what may be called "positron-deep level transient spectroscopy", and (ii) the extraction of more spatial information on vacancy defects by means of what may be called "Fourier transform Doppler broadening of annihilation radiation spectroscopy".
Persistent Identifierhttp://hdl.handle.net/10722/80783
ISSN
2005 Impact Factor: 0.399
References

 

DC FieldValueLanguage
dc.contributor.authorBeling, CDen_HK
dc.contributor.authorFung, Sen_HK
dc.date.accessioned2010-09-06T08:10:13Z-
dc.date.available2010-09-06T08:10:13Z-
dc.date.issued2001en_HK
dc.identifier.citationMaterials Science Forum, 2001, v. 363-365, p. 25-29en_HK
dc.identifier.issn0255-5476en_HK
dc.identifier.urihttp://hdl.handle.net/10722/80783-
dc.description.abstractThe current use of the lifetime and Doppler broadening techniques in defect identification is demonstrated with two studies, the first being the identification of carbon vacancy in n-6H SiC through lifetime spectroscopy, and the second the production of de-hydrogenated voids in α-Si:H through light soaking. Some less conventional ideas are presented for more specific defect identification, namely (i) the amalgamation of lifetime and Doppler techniques with conventional deep level transient spectroscopy in what may be called "positron-deep level transient spectroscopy", and (ii) the extraction of more spatial information on vacancy defects by means of what may be called "Fourier transform Doppler broadening of annihilation radiation spectroscopy".en_HK
dc.languageengen_HK
dc.publisherTrans Tech Publications Ltd. The Journal's web site is located at http://www.scientific.neten_HK
dc.relation.ispartofMaterials Science Forumen_HK
dc.rightsMaterials Science Forum. Copyright © Trans Tech Publications Ltd.en_HK
dc.subjectα-Si:Hen_HK
dc.subject6H-SiCen_HK
dc.subjectDeep level transient spectroscopyen_HK
dc.subjectDoppler broadening spectroscopyen_HK
dc.subjectDouble Doppler broadening spectroscopyen_HK
dc.subjectLifetime spectroscopyen_HK
dc.subjectPositron deep level transient spectroscopyen_HK
dc.titleDefect identification using positronsen_HK
dc.typeConference_Paperen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0255-5476&volume=363-365&spage=25&epage=29&date=2001&atitle=Defect+Identification+Using+Positronsen_HK
dc.identifier.emailBeling, CD: cdbeling@hkucc.hku.hken_HK
dc.identifier.emailFung, S: sfung@hku.hken_HK
dc.identifier.authorityBeling, CD=rp00660en_HK
dc.identifier.authorityFung, S=rp00695en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.scopuseid_2-s2.0-0035019122en_HK
dc.identifier.hkuros56847en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0035019122&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume363-365en_HK
dc.identifier.spage25en_HK
dc.identifier.epage29en_HK
dc.publisher.placeSwitzerlanden_HK
dc.identifier.scopusauthoridBeling, CD=7005864180en_HK
dc.identifier.scopusauthoridFung, S=7201970040en_HK

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